Temperature and injection dependence of the Shockley–Read–Hall lifetime in electron irradiated n‐type silicon H Bleichner, P Jonsson, N Keskitalo, E Nordlander Journal of Applied Physics 79 (12), 9142-9148, 1996 | 91 | 1996 |
The ambipolar diffusion coefficient in silicon: Dependence on excess‐carrier concentration and temperature M Rosling, H Bleichner, P Jonsson, E Nordlander Journal of applied physics 76 (5), 2855-2859, 1994 | 84 | 1994 |
The ambipolar Auger coefficient: Measured temperature dependence in electron irradiated and highly injected n-type silicon P Jonsson, H Bleichner, M Isberg, E Nordlander Journal of applied physics 81 (5), 2256-2262, 1997 | 52 | 1997 |
On the concept image of complex numbers MC Nordlander, E Nordlander International Journal of Mathematical Education in Science and Technology 43 …, 2012 | 49 | 2012 |
A novel technique for the simultaneous measurement of ambipolar carrier lifetime and diffusion coefficient in silicon M Rosling, H Bleichner, M Lundqvist, E Nordlander Solid-state electronics 35 (9), 1223-1227, 1992 | 32 | 1992 |
Temperature and injection dependence of the Shockley–Read–Hall lifetime in electron-irradiated -type silicon N Keskitalo, P Jonsson, K Nordgren, H Bleichner, E Nordlander Journal of applied physics 83 (8), 4206-4212, 1998 | 27 | 1998 |
A time-resolved optical system for spatial characterization of the carrier distribution in a gate turn-off thyristor (GTO) H Bleichner, E Nordlander, M Rosling, S Berg IEEE transactions on instrumentation and measurement 39 (3), 473-478, 1990 | 25 | 1990 |
A study of turn-off limitations and failure mechanisms of GTO thyristors by means of 2-D time-resolved optical measurements H Bleichner, M Bakowski, M Rosling, E Nordlander, J Vobecky, ... Solid-state electronics 35 (11), 1683-1695, 1992 | 24 | 1992 |
Influence of students’ attitudes and beliefs on the ability of solving mathematical problems with irrelevant information MC Nordlander, E Nordlander Beliefs and attitudes in mathematics education, 165-178, 2009 | 18 | 2009 |
Vad tycker tekniklärarna? E Nordlander Teknikutbildning för framtiden, 90-102, 2011 | 15 | 2011 |
An optical system for bilateral recombination-radiation diagnostics of the carrier redistribution in switching power devices M Lundqvist, H Bleichner, E Nordlander IEEE transactions on instrumentation and measurement 40 (6), 956-961, 1991 | 11 | 1991 |
Flying-spot scanning for the separate mapping of resistivity and minority-carrier lifetime in silicon H Bleichner, E Nordlander, G Fiedler, PA Tove Solid-state electronics 29 (8), 779-786, 1986 | 9 | 1986 |
Laser scanning technique for the detection of resistivity inhomogeneities in silicon using liquid rectifying contacts B Drugge, E Nordlander IEEE transactions on electron Devices 27 (11), 2124-2127, 1980 | 9 | 1980 |
Teknik i skolan–en utmaning för samhället E Nordlander, J Grenholm Gävle University Press, 2016 | 8 | 2016 |
Measurements of failure phenomena in inductively loaded multi-cathode GTO thyristors H Bleichner, M Rosling, M Bakowski, J Vobecky, E Nordlander IEEE transactions on electron devices 41 (2), 251-257, 1994 | 8 | 1994 |
A comparative study of the carrier distributions in dynamically operating GTO's by means of two optically probed measurement methods H Bleichner, M Rosling, J Vobecky, M Lundqvist, E Nordlander Proceedings of the 2nd International Symposium on Power Semiconductor …, 1990 | 8 | 1990 |
Teknikutbildning för framtiden: perspektiv på teknikundervisningen i grundskola och gymnasium SO Hansson, E Nordlander, IB Skogh Liber, 2011 | 7 | 2011 |
The effect of emitter shortings on turn-off limitations and device failure in GTO thyristors under snubberless operation H Bleichner, K Nordgren, M Rosling, M Bakowski, E Nordlander IEEE transactions on electron devices 42 (1), 178-187, 1995 | 7 | 1995 |
On the concept image of complex numbers M Cortas Nordlander, E Nordlander International journal of mathematical education in science and technology 43 …, 2012 | 5 | 2012 |
Komplexa tal är inte så komplexa! MC Nordlander, E Nordlander Hämtad från NCM: Nationellt centrum för matematikutbildning: http://ncm. gu …, 2010 | 5 | 2010 |