Follow
Yiping Xiao
Title
Cited by
Cited by
Year
Variability and Yield in h‐BN‐Based Memristive Circuits: The Role of Each Type of Defect
Y Shen, W Zheng, K Zhu, Y Xiao, C Wen, Y Liu, X Jing, M Lanza
Advanced Materials 33 (41), 2103656, 2021
642021
Highly accurate thickness determination of 2D materials
Y Xiao, W Zheng, B Yuan, C Wen, M Lanza
Crystal Research and Technology 56 (6), 2100056, 2021
142021
Memristors with Initial Low‐Resistive State for Efficient Neuromorphic Systems
K Zhu, MR Mahmoodi, Z Fahimi, Y Xiao, T Wang, K Bukvišová, M Kolíbal, ...
Advanced Intelligent Systems 4 (8), 2200001, 2022
132022
Effect of the pressure exerted by probe station tips in the electrical characteristics of memristors
Y Zuo, H Lin, J Guo, Y Yuan, H He, Y Li, Y Xiao, X Li, K Zhu, T Wang, ...
Advanced Electronic Materials 6 (3), 1901226, 2020
122020
An electrical model for trap coupling effects on random telegraph noise
T Becker, X Li, P Alves, T Wang, K Zhu, Y Xiao, G Wirth, M Lanza
IEEE Electron Device Letters 41 (10), 1596-1599, 2020
92020
Modeling the variability of Au/Ti/h-BN/Au memristive devices
JB Roldan, D Maldonado, C Aguilera-Pedregosa, FJ Alonso, Y Xiao, ...
IEEE Transactions on Electron Devices 70 (4), 1533-1539, 2022
42022
A Porous Perovskite Nanofiber with Reinforced Aerophobicity for High‐Performance Anion Exchange Membrane Water Splitting
L Li, Z Zheng, J Li, Y Mu, Y Wang, Z Huang, Y Xiao, H Huang, S Wang, ...
Small 19 (38), 2301261, 2023
32023
Self‐Assembly of Janus Graphene Oxide via Chemical Breakdown for Scalable High‐Performance Memristors
F Hui, C Zhang, H Yu, T Han, J Weber, Y Shen, Y Xiao, X Li, Z Zhang, ...
Advanced Functional Materials, 2302073, 2023
12023
The system can't perform the operation now. Try again later.
Articles 1–8