| Study on experimental characterization of carbon fiber reinforced polymer panel using digital image correlation: A sensitivity analysis M Kashfuddoja, RGR Prasath, M Ramji Optics and Lasers in Engineering 62, 17-30, 2014 | 77 | 2014 |
| Colour adaptation in three fringe photoelasticity KR Madhu, RGR Prasath, K Ramesh Experimental Mechanics 47, 271-276, 2007 | 43 | 2007 |
| Sensitivity of isoclinic data using various phase shifting techniques in digital photoelasticity towards generalized error sources M Ramji, RGR Prasath Optics and Lasers in Engineering 49 (9-10), 1153-1167, 2011 | 35 | 2011 |
| Effect of growth rate and wafering on residual stress of diamond wire sawn silicon wafers A Kumar, RGR Prasath, V Pogue, K Skenes, C Yang, SN Melkote, ... Procedia Manufacturing 5, 1382-1393, 2016 | 26 | 2016 |
| Comparison of Phase Shifting Techniques for Measuring In-Plane Residual Stress in Thin, Flat Silicon Wafers RGR Prasath, K Skenes, S Danyluk Journal of Electronic Materials, 1-8, 2013 | 26 | 2013 |
| Transient thermal stress intensity factors of bimaterial interface cracks using refined three-fringe photoelasticity BN Simon, RGR Prasath, K Ramesh The Journal of Strain Analysis for Engineering Design 44 (6), 427-438, 2009 | 19 | 2009 |
| Crystallographic orientation identification in multicrystalline silicon wafers using NIR transmission intensity K Skenes, A Kumar, RGR Prasath, S Danyluk Journal of Electronic Materials 47, 1030-1037, 2018 | 13 | 2018 |
| Stress monitoring of PET beverage bottles by Digital Photoelasticity RGR Prasath, T Newton, S Danyluk Manufacturing Letters 15, 9-13, 2018 | 11 | 2018 |
| Noise‐Free Determination of Isochromatic Parameter of Stereolithography‐Built Models K Ashokan, RGR Prasath, K Ramesh Experimental Techniques 36 (2), 70-75, 2012 | 11 | 2012 |
| Spatial distribution of full-field residual stress and its correlation with fracture strength of thin silicon wafers A Kumar, K Skenes, RGR Prasath, C Yang, SN Melkote, S Danyluk Proceedings of the 28th European Photovoltaic Solar Energy Conference and …, 2013 | 9 | 2013 |
| A generic error simulation in digital photoelasticity by Jones calculus M Ramji, RGR Prasath, K Ramesh Journal of Aerospace Sciences and Technologies, 475-481, 2009 | 8 | 2009 |
| Non-contact stress measurement in PET preforms RGR Prasath, S Danyluk, S Zagarola Polymer-Plastics Technology and Materials 58 (16), 1802-1809, 2019 | 6 | 2019 |
| Autonomous isochromatic phase unwrapping by domain delimiting in digital photoelasticity K Ashokan, M Ramji, R RajaGuruprasath, K Ramesh CD Proc. VII Int. Conf. on Optoelectronics Fibre Optics and Photonics, 13-16, 2006 | 6 | 2006 |
| Visualization of delamination in encapsulated flexible electronics fabricated using slot die coating TJ Jeong, RGR Prasath, SK Sitaraman, TAL Harris Journal of Electronic Materials 49, 3332-3339, 2020 | 5 | 2020 |
| Polariscopy measurement of Residual stress in thin silicon wafers K Skenes, RGR Prasath, S Danyluk SEM annual conference and Exposition on Experimental and Applied Mechanics, 2013 | 5 | 2013 |
| Measurement of residual stresses around vickers indentations on silicon surfaces via nir polariscope K Skenes, R Prasath, S Danyluk Proceedings of the 28th European PV and Solar Energy Conference and …, 2013 | 2 | 2013 |
| Silicon grain crystallographic orientation measurement from NIR transmission and reflection K Skenes, G Prasath, S Danyluk 2013 IEEE 39th Photovoltaic Specialists Conference (PVSC), 0519-0522, 2013 | 1 | 2013 |
| Study of Matrix Crack and Inclusion Interactions Using Digital Photoealsticity and FEA RGR Prasath, M Ramji Fourth International Conference on Structural Stability and Dynamics, 2012 | 1 | 2012 |
| A Comparison of Residual Stress Induced by Fixed Abrasive Diamond Wire Sawing and Loose Abrasive Slurry Wire Sawing in Multicrystalline Silicon Wafers SD V. Pogue, S. Melkote, R.G.R. Prasath 32nd European Photovoltaic Solar Energy Conference and Exhibition, 1049 - 1052, 2016 | | 2016 |
| Road Noise Identification and Reduction Measures MV Rao, R Prasath, S Patil, KS Mansinh SAE Technical Paper, 2013 | | 2013 |
Ramji ManoharanIIT HyderabadGeverifieerd e-mailadres voor iith.ac.in
