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Vincent P. LaBella
Vincent P. LaBella
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Above room temperature ferromagnetism in Mn-ion implanted Si
M Bolduc, C Awo-Affouda, A Stollenwerk, MB Huang, FG Ramos, ...
Physical Review B 71 (3), 033302, 2005
3342005
Atomic structure of the GaAs (001)−(2× 4) surface resolved using scanning tunneling microscopy and first-principles theory
VP LaBella, H Yang, DW Bullock, PM Thibado, P Kratzer, M Scheffler
Physical Review Letters 83 (15), 2989, 1999
2201999
Spatially resolved spin-injection probability for gallium arsenide
VP LaBella, DW Bullock, Z Ding, C Emery, A Venkatesan, WF Oliver, ...
Science 292 (5521), 1518-1521, 2001
1442001
Arsenic-rich GaAs (0 0 1) surface structure
VP LaBella, MR Krause, Z Ding, PM Thibado
Surface science reports 60 (1-4), 1-53, 2005
1252005
Enhancing the student-instructor interaction frequency
DW Bullock, VP LaBella, T Clingan, Z Ding, G Stewart, PM Thibado
Physics Teacher 40 (9), 535-541, 2002
1152002
Monte Carlo derived diffusion parameters for Ga on the GaAs(001)- surface: A molecular beam epitaxy–scanning tunneling microscopy study
VP LaBella, DW Bullock, Z Ding, C Emery, WG Harter, PM Thibado
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 18 (4 …, 2000
652000
Measurement of hot-electron scattering processes at Au/Si (100) Schottky interfaces by temperature-dependent ballistic-electron-emission microscopy
CA Ventrice Jr, VP LaBella, G Ramaswamy, HP Yu, LJ Schowalter
Physical Review B 53 (7), 3952, 1996
581996
Observation of crystallite formation in ferromagnetic Mn-implanted Si
C Awo-Affouda, M Bolduc, MB Huang, F Ramos, KA Dunn, B Thiel, ...
Journal of Vacuum Science & Technology A 24 (4), 1644-1647, 2006
542006
Atomic-scale observation of temperature and pressure driven preroughening and roughening
Z Ding, DW Bullock, PM Thibado, VP LaBella, K Mullen
Physical review letters 90 (21), 216109, 2003
522003
Enabling electron diffraction as a tool for determining substrate temperature and surface morphology
VP LaBella, DW Bullock, C Emery, Z Ding, PM Thibado
Applied Physics Letters 79 (19), 3065-3067, 2001
502001
Fermi Level Manipulation through Native Doping in the Topological Insulator Bi2Se3
LA Walsh, AJ Green, R Addou, W Nolting, CR Cormier, AT Barton, ...
ACS nano 12 (6), 6310-6318, 2018
472018
Microscopic view of a two-dimensional lattice-gas Ising system within the grand canonical ensemble
VP LaBella, DW Bullock, M Anser, Z Ding, C Emery, L Bellaiche, ...
Physical Review Letters 84 (18), 4152, 2000
442000
Schottky barrier height measurements of Cu/Si (001), Ag/Si (001), and Au/Si (001) interfaces utilizing ballistic electron emission microscopy and ballistic hole emission microscopy
R Balsano, A Matsubayashi, VP LaBella
Aip Advances 3 (11), 2013
412013
Reflection high-energy electron diffraction and scanning tunneling microscopy study of InP (001) surface reconstructions
VP LaBella, Z Ding, DW Bullock, C Emery, PM Thibado
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 18 (4 …, 2000
402000
Activation energy for Ga diffusion on the GaAs (0 0 1)-(2× 4) surface: an MBE-STM study
H Yang, VP LaBella, DW Bullock, Z Ding, JB Smathers, PM Thibado
Journal of crystal growth 201, 88-92, 1999
351999
Electronic structure changes of from subsurface Mn observed by STM
MR Krause, AJ Stollenwerk, J Reed, VP LaBella, M Hortamani, P Kratzer, ...
Physical Review B 75 (20), 205326, 2007
342007
Annealing temperature effects on the structure of ferromagnetic Mn-implanted Si
M Bolduc, C Awo-Affouda, F Ramos, VP LaBella
Journal of Vacuum Science & Technology A 24 (4), 1648-1651, 2006
312006
Combined molecular beam epitaxy low temperature scanning tunneling microscopy system: Enabling atomic scale characterization of semiconductor surfaces and interfaces
M Krause, A Stollenwerk, C Awo-Affouda, B Maclean, VP LaBella
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005
312005
Role of in Ga diffusion on the GaAs(001)-(2×4) surface: A molecular beam epitaxy-scanning tunneling microscopy study
H Yang, VP LaBella, DW Bullock, PM Thibado
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999
301999
Fabrication of 5-20 nm thick β-W films
AJ Narasimham, M Medikonda, A Matsubayashi, P Khare, H Chong, ...
AIP Advances 4 (11), 2014
262014
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