| The ASTRA Toolbox: A platform for advanced algorithm development in electron tomography W Van Aarle, WJ Palenstijn, J De Beenhouwer, T Altantzis, S Bals, ... Ultramicroscopy 157, 35-47, 2015 | 773 | 2015 |
| Fast and flexible X-ray tomography using the ASTRA toolbox W Van Aarle, WJ Palenstijn, J Cant, E Janssens, F Bleichrodt, ... Optics express 24 (22), 25129-25147, 2016 | 744 | 2016 |
| Three-dimensional atomic imaging of crystalline nanoparticles S Van Aert, KJ Batenburg, MD Rossell, R Erni, G Van Tendeloo Nature 470 (7334), 374-377, 2011 | 624 | 2011 |
| DART: a practical reconstruction algorithm for discrete tomography KJ Batenburg, J Sijbers IEEE Transactions on Image Processing 20 (9), 2542-2553, 2011 | 376 | 2011 |
| Performance improvements for iterative electron tomography reconstruction using graphics processing units (GPUs) WJ Palenstijn, KJ Batenburg, J Sijbers Journal of structural biology 176 (2), 250-253, 2011 | 375 | 2011 |
| 3D imaging of nanomaterials by discrete tomography KJ Batenburg, S Bals, J Sijbers, C Kübel, PA Midgley, JC Hernandez, ... Ultramicroscopy 109 (6), 730-740, 2009 | 353 | 2009 |
| Electron tomography based on a total variation minimization reconstruction technique B Goris, W Van den Broek, KJ Batenburg, HH Mezerji, S Bals Ultramicroscopy 113, 120-130, 2012 | 237 | 2012 |
| Iterative correction of beam hardening artifacts in CT G Van Gompel, K Van Slambrouck, M Defrise, KJ Batenburg, J De Mey, ... Medical physics 38 (S1), S36-S49, 2011 | 172 | 2011 |
| Motion tracking-enhanced MART for tomographic PIV M Novara, KJ Batenburg, F Scarano Measurement science and technology 21 (3), 035401, 2010 | 171 | 2010 |
| Three-dimensional atomic imaging of colloidal core–shell nanocrystals S Bals, M Casavola, MA van Huis, S Van Aert, KJ Batenburg, ... Nano letters 11 (8), 3420-3424, 2011 | 160 | 2011 |
| Advances in X-ray diffraction contrast tomography: flexibility in the setup geometry and application to multiphase materials P Reischig, A King, L Nervo, N Viganó, Y Guilhem, WJ Palenstijn, ... Journal of Applied Crystallography 46 (2), 297-311, 2013 | 134 | 2013 |
| Measuring lattice strain in three dimensions through electron microscopy B Goris, J De Beenhouwer, A De Backer, D Zanaga, KJ Batenburg, ... Nano letters 15 (10), 6996-7001, 2015 | 131 | 2015 |
| Quantitative three-dimensional reconstruction of catalyst particles for bamboo-like carbon nanotubes S Bals, KJ Batenburg, J Verbeeck, J Sijbers, G Van Tendeloo Nano Letters 7 (12), 3669-3674, 2007 | 112 | 2007 |
| Integration of TomoPy and the ASTRA toolbox for advanced processing and reconstruction of tomographic synchrotron data DM Pelt, D Gürsoy, WJ Palenstijn, J Sijbers, F De Carlo, KJ Batenburg Journal of synchrotron radiation 23 (3), 842-849, 2016 | 111 | 2016 |
| Measuring porosity at the nanoscale by quantitative electron tomography E Biermans, L Molina, KJ Batenburg, S Bals, G Van Tendeloo Nano letters 10 (12), 5014-5019, 2010 | 109 | 2010 |
| Improving tomographic reconstruction from limited data using mixed-scale dense convolutional neural networks DM Pelt, KJ Batenburg, JA Sethian Journal of Imaging 4 (11), 128, 2018 | 108 | 2018 |
| 3-D reconstruction of the atomic positions in a simulated gold nanocrystal based on discrete tomography: Prospects of atomic resolution electron tomography JR Jinschek, KJ Batenburg, HA Calderon, R Kilaas, V Radmilovic, ... Ultramicroscopy 108 (6), 589-604, 2008 | 108 | 2008 |
| Fast tomographic reconstruction from limited data using artificial neural networks DM Pelt, KJ Batenburg IEEE Transactions on Image Processing 22 (12), 5238-5251, 2013 | 107 | 2013 |
| Advanced reconstruction algorithms for electron tomography: from comparison to combination B Goris, T Roelandts, KJ Batenburg, HH Mezerji, S Bals Ultramicroscopy 127, 40-47, 2013 | 100 | 2013 |
| Optimal threshold selection for tomogram segmentation by projection distance minimization KJ Batenburg, J Sijbers IEEE Transactions on Medical Imaging 28 (5), 676-686, 2008 | 91 | 2008 |
