A systematic study on MOS type radiation sensors E Yilmaz, B Kaleli, R Turan Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007 | 37 | 2007 |
On Device Architectures, Subthreshold Swing, and Power Consumption of the Piezoelectric Field-Effect Transistor ( -FET) RJE Hueting, T Van Hemert, B Kaleli, RAM Wolters, J Schmitz IEEE Journal of the Electron Devices Society 3 (3), 149-157, 2015 | 20 | 2015 |
Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode B Kaleli, MD Nguyen, J Schmitz, RAM Wolters, RJE Hueting Microelectronic engineering 119, 16-19, 2014 | 16 | 2014 |
Integration of a piezoelectric layer on Si FinFETs for tunable strained device applications B Kaleli, RJE Hueting, MD Nguyen, RAM Wolters IEEE Transactions on Electron Devices 61 (6), 1929-1935, 2014 | 14 | 2014 |
Mechanisms of light emission from terbium ions (Tb3+) embedded in a Si rich silicon oxide matrix B Kaleli, M Kulakci, R Turan Optical Materials 34 (11), 1935-1939, 2012 | 13 | 2012 |
Interface trap density estimation in FinFETs from the subthreshold current J Schmitz, B Kaleli, P Kuipers, N Van Den Berg, SM Smits, RJE Hueting 2016 International Conference on Microelectronic Test Structures (ICMTS …, 2016 | 6 | 2016 |
Strain and conduction-band offset in narrow n-type FinFETs T van Hemert, B Kaleli, RJE Hueting, D Esseni, MJH Van Dal, J Schmitz IEEE transactions on electron devices 60 (3), 1005-1010, 2013 | 5 | 2013 |
Strain characterization of FinFETs using Raman spectroscopy B Kaleli, T van Hemert, RJE Hueting, RAM Wolters Thin solid films 541, 57-61, 2013 | 3 | 2013 |
Characterization of strained silicon FinFETs and the integration of a piezoelectric layer B Kaleli | 2 | 2013 |
Towards silicon based light emitting devices: Photoluminescence from terbium doped silicon matrices with or without nanocrystals B Kaleli Middle East Technical University, 2009 | 2 | 2009 |
Analysis of ferroelectric and electrical properties of sub-100 nm thick PZT/LNO stacks on an encapsulated TiN electrode B Kaleli, MD Nguyen, J Schmitz, RAM Wolters, RJE Hueting 39th International Conference on Mico and Nano Engineering (MNE), 2013 | | 2013 |