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Mehmet Çakmak
Mehmet Çakmak
Professor in Gazi University, Ankara, Turkey
Geverifieerd e-mailadres voor gazi.edu.tr
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The behavior of the I‐V‐T characteristics of inhomogeneous (Ni∕ Au)–Al 0.3 Ga 0.7 N∕ Al N∕ Ga N heterostructures at high temperatures
Z Tekeli, Ş Altındal, M Çakmak, S Özçelik, D Çalışkan, E Özbay
Journal of Applied Physics 102 (5), 054510, 2007
902007
Structural, morphological, and optical properties of AlGaN/GaN heterostructures with AlN buffer and interlayer
S Çörekçi, MK Öztürk, B Akaoğlu, M Çakmak, S Özçelik, E Özbay
Journal of Applied Physics 101 (12), 123502, 2007
502007
Molecular design of photoswitchable surfaces with controllable wettability
GB Demirel, N Dilsiz, M Çakmak, T Çaykara
Journal of Materials Chemistry 21 (9), 3189-3196, 2011
392011
Dissociative adsorption of on the Si(001) surface
M Cakmak, GP Srivastava
Physical Review B 61 (15), 10216, 2000
392000
Surface structure and photoluminescence properties of AZO thin films on polymer substrates
N Akin, Y Ozen, HI Efkere, M Cakmak, S Ozcelik
Surface and Interface Analysis 47 (1), 93-98, 2015
322015
The profile of temperature and voltage dependent series resistance and the interface states in (Ni/Au)/Al0. 3Ga0. 7N/AlN/GaN heterostructures
Z Tekeli, Ş Altındal, M Çakmak, S Özçelik, E Özbay
Microelectronic Engineering 85 (11), 2316-2321, 2008
312008
Effect of molecular and electronic structure on the light-harvesting properties of dye sensitizers
E Mete, D Uner, M Çakmak, O Gulseren, Ş Ellialtoǧlu
The Journal of Physical Chemistry C 111 (20), 7539-7547, 2007
312007
Coordination dependence of hyperfine interactions at impurities on fcc metal surfaces. I. Electric-field gradient
S Cottenier, V Bellini, M Cakmak, F Manghi, M Rots
Physical Review B 70 (15), 155418, 2004
302004
Adsorption of partially and fully dissociated molecules on the Si(001) and Ge(001) surfaces
M Cakmak, GP Srivastava
Physical Review B 60 (8), 5497, 1999
301999
Effect of bleaching on roughness of dental composite resins
A Dogan, S Ozcelik, OM Dogan, I Hubbezoglu, M Cakmak, G Bolayir
The Journal of Adhesion 84 (11), 897-914, 2008
272008
Identification of Ge/Si intermixing processes at the Bi/Ge/Si (111) surface
N Paul, S Filimonov, V Cherepanov, M Çakmak, B Voigtländer
Physical review letters 98 (16), 166104, 2007
272007
AZO thin film-based UV sensors: effects of RF power on the films
N Akin, U Ceren Baskose, B Kinaci, M Cakmak, S Ozcelik
Applied Physics A 119, 965-970, 2015
262015
Effects of thermal annealing and film thickness on the structural and morphological properties of titanium dioxide films
S Çörekçí, K Kızılkaya, T Asar, M Öztürk, M Çakmak, S Özçelík
Acta Physica Polonica A 121 (1), 247-248, 2012
252012
The influence of thickness and ammonia flow rate on the properties of AlN layers
S Çörekçi, MK Öztürk, M Çakmak, S Özçelik, E Özbay
Materials science in semiconductor processing 15 (1), 32-36, 2012
232012
Construction of a novel multilayer system and its use for oriented immobilization of immunoglobulin G
G Demirel, T Caykara, B Akaoğlu, M Cakmak
Surface science 601 (19), 4563-4570, 2007
222007
Ab initio study of atomic geometry, electronic states, and bonding for HS adsorption on III-V semiconductor (110)- surfaces
M Cakmak, GP Srivastava
Physical Review B 57 (8), 4486, 1998
221998
Effect of film thickness on properties of aluminum doped zinc oxide thin films deposition on polymer substrate
N Akin, S Sebnem Cetin, M Cakmak, T Memmedli, S Ozcelik
Journal of Materials Science: Materials in Electronics 24, 5091-5096, 2013
212013
Structural investigation and electronic band transitions of nanostructured TiO2 thin films
S Sebnem Cetin, S Corekci, M Cakmak, S Ozcelik
Crystal Research and Technology 46 (11), 1207-1214, 2011
192011
Characterization of an AlN buffer layer and a thick-GaN layer grown on sapphire substrate by MOCVD
S Çörekçi, MK Öztürk, A Bengi, M Çakmak, S Özçelik, E Özbay
Journal of materials science 46, 1606-1612, 2011
182011
Coordination-dependence of hyperfine interactions at impurities on fcc metal surfaces. II. Magnetic hyperfine field
V Bellini, S Cottenier, M Cakmak, F Manghi, M Rots
Physical Review B 70 (15), 155419, 2004
182004
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