Yada Zhu
Yada Zhu
Geverifieerd e-mailadres voor us.ibm.com
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Availability optimization of systems subject to competing risk
Y Zhu, EA Elsayed, H Liao, LY Chan
European Journal of Operational Research 202 (3), 781-788, 2010
712010
Method and system for wafer quality predictive modeling based on multi-source information with heterogeneous relatedness
Y Zhu, J He, RJ Baseman
US Patent 9,176,183, 2015
442015
Distribution network maintenance planning
A Hampapur, JR Kalagnanam, E Yashchin, Y Zhu
US Patent 8,799,042, 2014
392014
Port-of-entry inspection: sensor deployment policy optimization
EA Elsayed, CM Young, M Xie, H Zhang, Y Zhu
IEEE Transactions on Automation Science and Engineering 6 (2), 265-276, 2009
332009
Design of accelerated life testing plans under multiple stresses
Y Zhu, EA Elsayed
Naval Research Logistics (NRL) 60 (6), 468-478, 2013
292013
Design of equivalent accelerated life testing plans under different stress applications
Y Zhu, EA Elsayed
Quality Technology & Quantitative Management 8 (4), 463-478, 2011
242011
Reinforcement-learning based portfolio management with augmented asset movement prediction states
Y Ye, H Pei, B Wang, PY Chen, Y Zhu, J Xiao, B Li
Proceedings of the AAAI Conference on Artificial Intelligence 34 (01), 1112-1119, 2020
222020
Multi-stage optimization for periodic inspection planning of geo-distributed infrastructure systems
DT Phan, Y Zhu
European Journal of Operational Research 245 (3), 797-804, 2015
212015
Multiobjective optimization of a port-of-entry inspection policy
CM Young, M Li, Y Zhu, M Xie, EA Elsayed, T Asamov
IEEE transactions on automation science and engineering 7 (2), 392-400, 2009
212009
Detecting electricity theft via meter tampering using statistical methods
A Dhurandhar, JR Kalagnanam, SA Siegel, Y Zhu
US Patent 9,600,773, 2017
162017
Co-clustering structural temporal data with applications to semiconductor manufacturing
Y Zhu, J He
ACM Transactions on Knowledge Discovery from Data (TKDD) 10 (4), 1-18, 2016
152016
Multi-stage failure analysis and prediction
A Hampapur, H Li, Z Li, Y Zhu
US Patent 9,262,255, 2016
152016
Optimal design of accelerated life testing plans under progressive censoring
Y Zhu, EA Elsayed
Iie Transactions 45 (11), 1176-1187, 2013
152013
A unified framework for outlier detection in trace data analysis
Z Li, RJ Baseman, Y Zhu, FA Tipu, N Slonim, L Shpigelman
IEEE Transactions on Semiconductor Manufacturing 27 (1), 95-103, 2013
142013
Hierarchical multi-task learning with application to wafer quality prediction
J He, Y Zhu
2012 IEEE 12th International Conference on Data Mining, 290-298, 2012
132012
Maintenance planning and failure prediction from data observed within a time window
JRM Hosking, E Yashchin, Y Zhu
US Patent 8,880,962, 2014
122014
Local algorithm for user action prediction towards display ads
H Yang, Y Zhu, J He
Proceedings of the 23rd ACM SIGKDD International Conference on Knowledge …, 2017
112017
Run-to-run control utilizing virtual metrology in semiconductor manufacturing
RJ Baseman, J He, E Yashchin, Y Zhu
US Patent 9,299,623, 2016
112016
System and method for maintenance planning and failure prediction for equipment subject to periodic failure risk
JR Hosking, JR Kalagnanam, Y Zhu
US Patent 9,058,569, 2015
112015
E-tail product return prediction via hypergraph-based local graph cut
J Li, J He, Y Zhu
Proceedings of the 24th ACM SIGKDD International Conference on Knowledge …, 2018
102018
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Artikelen 1–20