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Yves Le Traon
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Flowdroid: Precise context, flow, field, object-sensitive and lifecycle-aware taint analysis for android apps
S Arzt, S Rasthofer, C Fritz, E Bodden, A Bartel, J Klein, Y Le Traon, ...
ACM sigplan notices 49 (6), 259-269, 2014
27552014
Androzoo: Collecting millions of android apps for the research community
K Allix, TF Bissyandé, J Klein, Y Le Traon
Proceedings of the 13th international conference on mining software …, 2016
10982016
Iccta: Detecting inter-component privacy leaks in android apps
L Li, A Bartel, TF Bissyandé, J Klein, Y Le Traon, S Arzt, S Rasthofer, ...
2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015
8092015
Effective {Inter-Component} communication mapping in android: An essential step towards holistic security analysis
D Octeau, P McDaniel, S Jha, A Bartel, E Bodden, J Klein, Y Le Traon
22nd USENIX Security Symposium (USENIX Security 13), 543-558, 2013
5792013
Mutation testing advances: an analysis and survey
M Papadakis, M Kintis, J Zhang, Y Jia, Y Le Traon, M Harman
Advances in computers 112, 275-378, 2019
5722019
A state-of the-art survey & testbed of fuzzy AHP (FAHP) applications
S Kubler, J Robert, W Derigent, A Voisin, Y Le Traon
Expert systems with applications 65, 398-422, 2016
5342016
Static analysis of android apps: A systematic literature review
L Li, TF Bissyandé, M Papadakis, S Rasthofer, A Bartel, D Octeau, J Klein, ...
Information and Software Technology 88, 67-95, 2017
4502017
Automatic test generation: A use case driven approach
C Nebut, F Fleurey, Y Le Traon, JM Jezequel
IEEE Transactions on Software Engineering 32 (3), 140-155, 2006
4342006
Refactoring UML models
G Sunyé, D Pollet, Y Le Traon, JM Jézéquel
International Conference on the Unified Modeling Language, 134-148, 2001
4282001
Metallaxis‐FL: mutation‐based fault localization
M Papadakis, Y Le Traon
Software Testing, Verification and Reliability 25 (5-7), 605-628, 2015
3882015
Dexpler: converting android dalvik bytecode to jimple for static analysis with soot
A Bartel, J Klein, Y Le Traon, M Monperrus
Proceedings of the ACM SIGPLAN International Workshop on State of the Art in …, 2012
3302012
Automated and scalable t-wise test case generation strategies for software product lines
G Perrouin, S Sen, J Klein, B Baudry, Y Le Traon
2010 Third international conference on software testing, verification and …, 2010
3132010
Improving test suites for efficient fault localization
B Baudry, F Fleurey, Y Le Traon
Proceedings of the 28th international conference on Software engineering, 82-91, 2006
2912006
Fixminer: Mining relevant fix patterns for automated program repair
A Koyuncu, K Liu, TF Bissyandé, D Kim, J Klein, M Monperrus, Y Le Traon
Empirical Software Engineering 25, 1980-2024, 2020
2602020
Bypassing the combinatorial explosion: Using similarity to generate and prioritize t-wise test configurations for software product lines
C Henard, M Papadakis, G Perrouin, J Klein, P Heymans, Y Le Traon
IEEE Transactions on Software Engineering 40 (7), 650-670, 2014
2582014
Trivial compiler equivalence: A large scale empirical study of a simple, fast and effective equivalent mutant detection technique
M Papadakis, Y Jia, M Harman, Y Le Traon
2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015
2512015
Permissioned blockchain frameworks in the industry: A comparison
J Polge, J Robert, Y Le Traon
Ict Express 7 (2), 229-233, 2021
2482021
Comparing white-box and black-box test prioritization
C Henard, M Papadakis, M Harman, Y Jia, Y Le Traon
Proceedings of the 38th International Conference on Software Engineering …, 2016
2442016
Got issues? who cares about it? a large scale investigation of issue trackers from github
TF Bissyandé, D Lo, L Jiang, L Réveillere, J Klein, Y Le Traon
2013 IEEE 24th international symposium on software reliability engineering …, 2013
2252013
Combining multi-objective search and constraint solving for configuring large software product lines
C Henard, M Papadakis, M Harman, Y Le Traon
2015 IEEE/ACM 37th IEEE International Conference on Software Engineering 1 …, 2015
2242015
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Artikelen 1–20