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Ke Huang
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Counterfeit Integrated Circuits: A Rising Threat in the Global Semiconductor Supply Chain
U Guin, K Huang, D DiMase, JM Carulli, M Tehranipoor, Y Makris
Proceedings of the IEEE 102 (8), 1207-1228, 2014
6172014
Hardware Trojan detection through golden chip-free statistical side-channel fingerprinting
Y Liu, K Huang, Y Makris
Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014
1372014
Parametric counterfeit IC detection via support vector machines
K Huang, JM Carulli, Y Makris
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012
972012
Counterfeit electronics: A rising threat in the semiconductor manufacturing industry
K Huang, JM Carulli, Y Makris
2013 IEEE International Test Conference (ITC), 1-4, 2013
712013
Recycled IC Detection Based on Statistical Methods
K Huang, Y Liu, N Korolija, JM Carulli, Y Makris
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015
642015
Diagnosis of local spot defects in analog circuits
K Huang, HG Stratigopoulos, S Mir, C Hora, Y Xing, B Kruseman
IEEE Transactions on Instrumentation and Measurement 61 (10), 2701-2712, 2012
622012
Fault diagnosis of analog circuits based on machine learning
K Huang, HG Stratigopoulos, S Mir
2010 Design, Automation & Test in Europe Conference & Exhibition (DATE 2010 …, 2010
612010
Ecological driving system for connected/automated vehicles using a two-stage control hierarchy
K Huang, X Yang, Y Lu, CC Mi, P Kondlapudi
IEEE Transactions on Intelligent Transportation Systems 19 (7), 2373-2384, 2018
602018
Eco-driving system for connected automated vehicles: Multi-objective trajectory optimization
XT Yang, K Huang, Z Zhang, ZA Zhang, F Lin
IEEE Transactions on Intelligent Transportation Systems 22 (12), 7837-7849, 2020
562020
Reconciling the IC test and security dichotomy
O Sinanoglu, N Karimi, J Rajendran, R Karri, Y Jin, K Huang, Y Makris
2013 18th IEEE European Test Symposium (ETS), 1-6, 2013
422013
Spatial correlation modeling for probe test cost reduction in RF devices
N Kupp, K Huang, JM Carulli Jr, Y Makris
Proceedings of the International Conference on Computer-Aided Design, 23-29, 2012
362012
Spatial estimation of wafer measurement parameters using gaussian process models
N Kupp, K Huang, J Carulli, Y Makris
2012 IEEE International Test Conference, 1-8, 2012
352012
A comparative study of one-shot statistical calibration methods for analog/RF ICs
Y Lu, KS Subramani, H Huang, N Kupp, K Huang, Y Makris
2015 IEEE International Test Conference (ITC), 1-10, 2015
332015
Concurrent hardware Trojan detection in wireless cryptographic ICs
Y Liu, G Volanis, K Huang, Y Makris
2015 IEEE International Test Conference (ITC), 1-8, 2015
332015
Real-time prediction for IC aging based on machine learning
K Huang, X Zhang, N Karimi
IEEE Transactions on Instrumentation and Measurement 68 (12), 4756-4764, 2019
272019
Handling discontinuous effects in modeling spatial correlation of wafer-level analog/RF tests
K Huang, N Kupp, JM Carulli, Y Makris
2013 Design, Automation & Test in Europe Conference & Exhibition (DATE), 553-558, 2013
272013
Process monitoring through wafer-level spatial variation decomposition
K Huang, N Kupp, JM Carulli, Y Makris
2013 IEEE International Test Conference (ITC), 1-10, 2013
232013
Low-cost analog/RF IC testing through combined intra-and inter-die correlation models
K Huang, N Kupp, C Xanthopoulos, JM Carulli, Y Makris
IEEE Design & Test 32 (1), 53-60, 2014
172014
On the Application of Binary Neural Networks in Oblivious Inference
M Samragh, S Hussain, X Zhang, K Huang, F Koushanfar
Proceedings of the IEEE/CVF Conference on Computer Vision and Pattern …, 2021
162021
FaceSigns: Semi-Fragile Neural Watermarks for Media Authentication and Countering Deepfakes
P Neekhara, S Hussain, X Zhang, K Huang, J McAuley, F Koushanfar
arXiv preprint arXiv:2204.01960, 2022
152022
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