| A 40gs/s 6b adc in 65nm cmos YM Greshishchev, J Aguirre, M Besson, R Gibbins, C Falt, P Flemke, ... 2010 IEEE International Solid-State Circuits Conference-(ISSCC), 390-391, 2010 | 245 | 2010 |
| A 24gs/s 6b adc in 90nm cmos P Schvan, J Bach, C Falt, P Flemke, R Gibbins, Y Greshishchev, ... 2008 IEEE International Solid-State Circuits Conference-Digest of Technical …, 2008 | 226 | 2008 |
| Analog circuit testing based on sensitivity computation and new circuit modeling NB Hamida, B Kaminska Proceedings of IEEE International Test Conference-(ITC), 652-661, 1993 | 117 | 1993 |
| A 56GS/s 6b DAC in 65nm CMOS with 256× 6b memory YM Greshishchev, D Pollex, SC Wang, M Besson, P Flemeke, S Szilagyi, ... 2011 IEEE International Solid-State Circuits Conference, 194-196, 2011 | 109 | 2011 |
| Multiple fault analog circuit testing by sensitivity analysis NB Hamida, B Kaminska Analog Integrated Circuits and Signal Processing 4, 231-243, 1993 | 88 | 1993 |
| Parametric fault simulation and test vector generation K Saab, N Ben-Hamida, B Kaminska Proceedings of the conference on Design, automation and test in Europe, 650-657, 2000 | 75 | 2000 |
| LIMSoft: automated tool for design and test integration of analog circuits NB Hamida, K Saab, D Marche, B Kaminska, G Quesnel Proceedings International Test Conference 1996. Test and Design Validity …, 1996 | 74 | 1996 |
| Digital-to-analog converter and generation of high-bandwidth analog signals SO GHARAN, Y Greshishchev, N Ben-Hamida, KB Roberts US Patent 10,374,623, 2019 | 51 | 2019 |
| LIMSoft: Automated tool for sensitivity analysis and test vector generation K Saab, D Marche, NB Hamida, B Kaminska IEE Proceedings-Circuits, Devices and Systems 143 (6), 386-392, 1996 | 47 | 1996 |
| Frequency-based BIST for analog circuit testing S Khaled, B Kaminska, B Courtois, M Lubaszewski Proceedings 13th IEEE VLSI Test Symposium, 54-59, 1995 | 45 | 1995 |
| Closing the gap between analog and digital testing K Saab, NB Hamida, B Kaminska IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2001 | 40 | 2001 |
| A perturbation based fault modeling and simulation for mixed-signal circuits N Ben-Hamida, K Saab, D Marche, B Kaminska Proceedings Sixth Asian Test Symposium (ATS'97), 182-187, 1997 | 32 | 1997 |
| Temporal epilepsy seizures monitoring and prediction using cross-correlation and chaos theory SA Tahar Haddad, Naim Ben-Hamida, Larbi Talbi, Ahmed Lakhssassi Healthcare Technology Letters 1 (1), p. 45 - 50, 2014 | 28 | 2014 |
| Temporal Epilepsy Seizures Monitoring and Prediction using Cross-Correlation and Chaos Theory SA Tahar Haddad, Naim Ben-Hamida Sixth International Workshop on Seizure Prediction, 43, 2013 | 28* | 2013 |
| A 22GS/s 5b adc in 0.13/spl mu/m SiGe BiCMOS P Schvan, D Pollex, SC Wang, C Falt, N Ben-Hamida 2006 IEEE International Solid State Circuits Conference-Digest of Technical …, 2006 | 27 | 2006 |
| Automatic test vector generation for mixed-signal circuits B Ayari, NB Hamida, B Kaminska Proceedings the European Design and Test Conference. ED&TC 1995, 458-463, 1995 | 24 | 1995 |
| Ultra-broadband and ultra-compact optical 90 hybrid based on 2× 4 MMI coupler with subwavelength gratings on silicon-on-insulator L Xu, Y Wang, D Patel, M Morsy-Osman, R Li, M Hui, M Parvizi, ... Optical Fiber Communication Conference, M3I. 7, 2018 | 17 | 2018 |
| Analysis and modeling of the phase detector hysteresis in bang-bang PLLs S Bashiri, S Aouini, N Ben-Hamida, C Plett IEEE Transactions on Circuits and Systems I: Regular Papers 62 (2), 347-355, 2014 | 15 | 2014 |
| Hierarchical functional level testability analysis NB Hamida, B Kaminska IEEE Européen Test Conference, 1991 | 14 | 1991 |
| A 60 GS/s 8-b DAC with> 29.5 dB SINAD up to Nyquist frequency in 7nm FinFET CMOS Y Greshishchev, J Aguirre, S Aouini, M Besson, R Gibbins, CY Gouk, ... 2019 IEEE BiCMOS and Compound semiconductor Integrated Circuits and …, 2019 | 13 | 2019 |
