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Co-authors
Cristiano NiclassApple Inc.Verified email at apple.com
Claudio BruschiniScientist, Ecole Polytechique Fédérale de Lausanne (EPFL)Verified email at epfl.ch
Robert K. HendersonProfessor, Personal Chair in Electronic Imaging, University of EdinburghVerified email at ed.ac.uk
Alberto Sangiovanni VincentelliProfessor of EECS, University of California, BerkeleyVerified email at eecs.berkeley.edu
Fabio SebastianoDelft University of TechnologyVerified email at tudelft.nl
David StoppaFondazione Bruno KesslerVerified email at fbk.eu
Harald HomullePhD TU DelftVerified email at tudelft.nl
Ivan Michel AntolovicEPFLVerified email at epfl.ch
Masoud BabaieDelft University of TechnologyVerified email at tudelft.nl
Chockalingam VeerappanDialog semiconductorVerified email at tudelft.nl
shingo mandaiDelft University of DelftVerified email at tudelft.nl
Lindsay GrantVP Process Engineering - OmnivisionVerified email at ovt.com
Martin WolfProfessor of Biomedical Optics, University of ZurichVerified email at usz.ch
Bishnu PatraPhD student, Quantum & Computer Engineering, TU DelftVerified email at tudelft.nl
Esteban VenialgoDelft University of TechnologyVerified email at tudelft.nl
Li DavidUniversity of StrathclydeVerified email at strath.ac.uk
Jeroen van DijkPhD Candidate, Delft University of TechnologyVerified email at tudelft.nl
Myung-Jae LeePrincipal Investigator / Senior Research Scientist, KIST (Korea Institute of Science and Technology)Verified email at kist.re.kr
Alper DemirProfessor of Electrical Engineering, Koc University, TurkeyVerified email at ku.edu.tr
Francesco RegazzoniALaRI - USIVerified email at alari.ch