| Impact of VT and Body-Biasing on Resistive Short Detection in 28nm UTBB FDSOI--LVT and RVT Configurations A Karel, M Comte, JM Galliere, F Azais, M Renovell 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 164-169, 2016 | 17 | 2016 |
| Comparative study of Bulk, FDSOI and FinFET technologies in presence of a resistive short defect A Karel, M Comte, JM Galliere, F Azais, M Renovell 2016 17th Latin-American Test Symposium (LATS), 129-134, 2016 | 12 | 2016 |
| Resistive bridging defect detection in bulk, fdsoi and finfet technologies A Karel, M Comte, JM Galliere, F Azais, M Renovell Journal of Electronic Testing 33, 515-527, 2017 | 10 | 2017 |
| Influence of body-biasing, supply voltage, and temperature on the detection of resistive short defects in FDSOI Technology A Karel, M Comte, JM Galliere, F Azais, M Renovell IEEE Transactions on Nanotechnology 16 (3), 417-430, 2017 | 8 | 2017 |
| Bistatic MIMO system with uniform circular arc arrays for single near field target localization J Du, B Wu, Y Yang, C Yuan, PR Singh, A Karel, L Li 2018 10th International Conference on Communication Software and Networks …, 2018 | 7 | 2018 |
| Detection of resistive open and short defects in FDSOI under delay-based test: Optimal VDD and body biasing conditions A Karel, F Azais, M Comte, JM Galliere, M Renovell, K Singh 2017 22nd IEEE European Test Symposium (ETS), 1-2, 2017 | 4 | 2017 |
| Analytical models for the evaluation of resistive short defect detectability in presence of process variations: application to 28nm bulk and FDSOI technologies A Karel, F Azaïs, M Comte, JM Gallière, M Renovell Journal of Electronic Testing 35, 59-75, 2019 | 2 | 2019 |
| Comparative Study of FinFET and FDSOI Nanometric Technologies Based on Manufacturing Defect Testability A Karel Université Montpellier, 2017 | 2 | 2017 |
| Impact of process variations on the detectability of resistive short defects: comparative analysis between 28nm bulk and FDSOI technologies A Karel, F Azais, M Comte, JM Galliere, M Renovell 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-5, 2018 | 1 | 2018 |
| Comprehensive Study for Detection of Weak Resistive Open and Short Defects in FDSOI Technology A Karel, F Azais, M Comte, JM Galliere, M Renovell, K Singh 2017 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 320-325, 2017 | 1 | 2017 |
| Amit Karel, Florence Azaıs, Mariane Comte, Jean-Marc J.-M. Galliere, and Michel Renovell. An-alytical Models for the Evaluation of Resistive Short Defect Detectability in … A Karel | | |
