Pieter Kruit
TitleCited byYear
Magnetic field paralleliser for 2π electron-spectrometer and electron-image magnifier
P Kruit, FH Read
Journal of Physics E: Scientific Instruments 16 (4), 313, 1983
Electron spectra from multiphoton ionization of xenon at 1064, 532, and 355 nm
P Kruit, J Kimman, HG Muller, MJ Van der Wiel
Physical Review A 28 (1), 248, 1983
Approaching the resolution limit of nanometer-scale electron beam-induced deposition
WF Van Dorp, B Van Someren, CW Hagen, P Kruit, PA Crozier
Nano letters 5 (7), 1303-1307, 2005
Field emission energy distributions from individual multiwalled carbon nanotubes
MJ Fransen, TL Van Rooy, P Kruit
Applied Surface Science 146 (1-4), 312-327, 1999
Absorption of additional photons in the multiphoton ionisation continuum of xenon at 1064, 532 and 440 nm
P Kruit, J Kimman, MJ Van der Wiel
Journal of Physics B: Atomic and Molecular Physics 14 (19), L597, 1981
Addition of different contributions to the charged particle probe size
Optik 101, 101-109, 1996
Direct fabrication of nanowires in an electron microscope
N Silvis-Cividjian, CW Hagen, P Kruit, MAJ vd Stam, HB Groen
Applied Physics Letters 82 (20), 3514-3516, 2003
10 nm lines and spaces written in HSQ, using electron beam lithography
AE Grigorescu, MC Van der Krogt, CW Hagen, P Kruit
Microelectronic Engineering 84 (5-8), 822-824, 2007
The role of secondary electrons in electron-beam-induced-deposition spatial resolution
N Silvis-Cividjian, CW Hagen, LHA Leunissen, P Kruit
Microelectronic engineering 61, 693-699, 2002
Quantitative data processing of parallel recorded electron energy‐loss spectra with low signal to background
H Shuman, P Kruit
Review of scientific instruments 56 (2), 231-239, 1985
Spatial resolution limits in electron-beam-induced deposition
N Silvis-Cividjian, CW Hagen, P Kruit
Journal of Applied Physics 98 (8), 084905, 2005
Resonantly enhanced multiphoton ionization of xenon: photoelectron enrgy analysis
RN Compton, JC Miller, AE Carter, P Kruit
Chemical Physics Letters 71 (1), 87-90, 1980
Simultaneous correlative scanning electron and high-NA fluorescence microscopy
N Liv, AC Zonnevylle, AC Narvaez, APJ Effting, PW Voorneveld, ...
PloS one 8 (2), e55707, 2013
Electron beam exposure system
MJ Wieland, BJ Kampherbeek, AHV Van Veen, P Kruit
US Patent 6,897,458, 2005
Highly resolved electron spectra for resonantly enhanced four-photon ionization of no
J Kimman, P Kruit, MJ Van der Wiel
Chemical Physics Letters 88 (6), 576-580, 1982
Apparatus for generating a plurality of beamlets
P Kruit
US Patent 7,129,502, 2006
Construction and characterization of the fringe field monochromator for a field emission gun
HW Mook, P Kruit
Ultramicroscopy 81 (3-4), 129-139, 2000
Lithography system
JJM Wieland, JC Van't Spijker, R Jager, P Kruit
US Patent 6,958,804, 2005
MAPPER: high throughput maskless lithography
E Slot, MJ Wieland, G De Boer, P Kruit, GF Ten Berge, AMC Houkes, ...
Emerging Lithographic Technologies XII 6921, 69211P, 2008
The radio continuum morphology of spiral galaxies
PC Van der Kruit, RJ Allen
Annual Review of Astronomy and Astrophysics 14 (1), 417-445, 1976
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Articles 1–20