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Prof. Andrew Lewis
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Cited by
Cited by
Year
Design for a compact high-accuracy CMM
GN Peggs, AJ Lewis, S Oldfield
CIRP Annals-Manufacturing Technology 48 (1), 417-420, 1999
2001999
Multi-channel absolute distance measurement system with sub ppm-accuracy and 20 m range using frequency scanning interferometry and gas absorption cells
J Dale, B Hughes, AJ Lancaster, AJ Lewis, AJH Reichold, MS Warden
Optics Express 22 (20), 24869-24893, 2014
1262014
Laser tracker error determination using a network measurement
B Hughes, A Forbes, A Lewis, W Sun, D Veal, K Nasr
Measurement Science and Technology 22 (4), 045103, 2011
1052011
Advances in traceable nanometrology at the National Physical Laboratory
R Leach, J Haycocks, K Jackson, A Lewis, S Oldfield, A Yacoot
Nanotechnology 12 (1), R1, 2001
1012001
Advice from the CCL on the use of unstabilized lasers as standards of wavelength: the helium–neon laser at 633 nm
JA Stone, JE Decker, P Gill, P Juncar, A Lewis, GD Rovera, M Viliesid
Metrologia 46 (1), 11, 2008
782008
Performance evaluation of a cheap, open source, digital environmental monitor based on the Raspberry Pi
AJ Lewis, M Campbell, P Stavroulakis
Measurement, 2016
762016
Measurement of length, surface form and thermal expansion coefficient of length bars up to 1.5 m using multiple-wavelength phase-stepping interferometry
A Lewis
Measurement Science and Technology 5 (6), 694, 1994
581994
Absolute length measurement using multiple-wavelength phase-stepping interferometry
AJ Lewis
PhD Thesis, 324, 1993
501993
Dual-Sweep Frequency Scanning Interferometry Using Four Wave Mixing
JJ Martinez, MA Campbell, MS Warden, EB Hughes, NJ Copner, AJ Lewis
IEEE Photonics Technology Letters 27 (7), 733-736, 2015
442015
Fully traceable miniature CMM with submicrometer uncertainty
AJ Lewis
Proceedings of SPIE 5190, 265-276, 2003
252003
The new mise en pratique for the metre—a review of approaches for the practical realization of traceable length metrology from 10− 11 m to 1013 m
R Schödel, A Yacoot, A Lewis
Metrologia 58 (5), 052002, 2021
242021
Measuring in three dimensions at the mesoscopic level
GN Peggs, A Lewis, RK Leach
Proc. ASPE Winter Topical Meeting—Machines and Processes for Micro-scale …, 2003
232003
CCL-K2: long gauge block measurement by interferometry
A Lewis
Metrologia 40 (1A), 04004-04004, 2003
20*2003
Long-term study of gauge block interferometer performance and gauge block stability
AJ Lewis, B Hughes, PJE Aldred
Metrologia 47 (4), 473, 2010
192010
ASME B89. 4.19 standard for laser tracker verification–experiences and optimisations
KM Nasr, AB Forbes, B Hughes, A Lewis
International Journal of Metrology and Quality Engineering 3 (2), 89-95, 2012
162012
Development of a high-accuracy multi-sensor, multi-target coordinate metrology system using frequency scanning interferometry and multilateration
B Hughes, MA Campbell, AJ Lewis, GM Lazzarini, N Kay
Videometrics, Range Imaging, and Applications XIV 10332, 1033202, 2017
152017
Report on the analysis of the MEMSTAND survey on standardisation of microsystems technology
L Singleton, R Leach, A Lewis, Z Cui
MEMSTAND Project IST-2001-37682, 2002
132002
Arcuate arm profilometry-traceable metrology for large mirrors
A Lewis, S Oldfield, M Callender, A Efstathiou, A Gee, C King, D Walker
Proceedings of Simposio de Metrologa, 101-105, 2006
122006
Swing arm profilometer for large telescope mirror element metrology
MJ Callender, A Efstathiou, CW King, DD Walker, AE Gee, AJ Lewis, ...
SPIE Astronomical Telescopes + Instrumentation, 62732R-62732R-12, 2006
112006
Determination of Laser Tracker Angle Encoder Errors
KM Nasr, B Hughes, A Forbes, A Lewis
EPJ Web of Conferences 77, 00002, 2014
92014
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