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Jaeyeon Jang
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Year
A dynamic control approach for energy-efficient production scheduling on a single machine under time-varying electricity pricing
S Lee, B Do Chung, HW Jeon, J Chang
Journal of Cleaner Production 165, 552-563, 2017
572017
Aggregate production planning considering implementation error: A robust optimization approach using bi-level particle swarm optimization
J Jang, B Do Chung
Computers & industrial engineering 142, 106367, 2020
342020
Discriminative feature learning and cluster-based defect label reconstruction for reducing uncertainty in wafer bin map labels
S Park, J Jang, CO Kim
Journal of Intelligent Manufacturing 32, 251-263, 2021
332021
Support weighted ensemble model for open set recognition of wafer map defects
J Jang, M Seo, CO Kim
IEEE Transactions on Semiconductor Manufacturing 33 (4), 635-643, 2020
282020
Collective decision of one-vs-rest networks for open-set recognition
J Jang, CO Kim
IEEE Transactions on Neural Networks and Learning Systems, 2022
242022
Denoised residual trace analysis for monitoring semiconductor process faults
J Jang, BW Min, CO Kim
IEEE Transactions on Semiconductor Manufacturing 32 (3), 293-301, 2019
242019
Siamese network-based health representation learning and robust reference-based remaining useful life prediction
J Jang, CO Kim
IEEE Transactions on Industrial Informatics 18 (8), 5264-5274, 2021
202021
Automatic inspection of salt-and-pepper defects in OLED panels using image processing and control chart techniques
J Kwak, KB Lee, J Jang, KS Chang, CO Kim
Journal of Intelligent Manufacturing 30, 1047-1055, 2019
172019
Adaptive weapon-to-target assignment model based on the real-time prediction of hit probability
J Jang, HG Yoon, JC Kim, CO Kim
IEEE Access 7, 72210-72220, 2019
162019
One-vs-rest network-based deep probability model for open set recognition
J Jang, CO Kim
arXiv preprint arXiv:2004.08067, 2020
152020
A run-to-run controller for a chemical mechanical planarization process using least squares generative adversarial networks
S Kim, J Jang, CO Kim
Journal of Intelligent Manufacturing 32, 2267-2280, 2021
112021
Unstructured borderline self-organizing map: Learning highly imbalanced, high-dimensional datasets for fault detection
J Jang, CO Kim
Expert Systems with Applications 188, 116028, 2022
102022
Decision fusion approach for detecting unknown wafer bin map patterns based on a deep multitask learning model
J Jang, GT Lee
Expert Systems with Applications 215, 119363, 2023
82023
Teacher–Explorer–Student Learning: A Novel Learning Method for Open Set Recognition
J Jang, CO Kim
IEEE Transactions on Neural Networks and Learning Systems, 2023
32023
Real-time path planning of controllable UAV by subgoals using goal-conditioned reinforcement learning
GT Lee, KJ Kim, J Jang
Applied Soft Computing 146, 110660, 2023
32023
Synthetic unknown class learning for learning unknowns
J Jang
Pattern Recognition 153, 110560, 2024
22024
Sequential residual learning for multistep processes in semiconductor manufacturing
GT Lee, HG Lim, J Jang
IEEE Transactions on Semiconductor Manufacturing 36 (1), 37-44, 2022
22022
A two-stage semi-supervised object detection method for SAR images with missing labels based on meta pseudo-labels
SR Baek, J Jang
Expert Systems with Applications 236, 121405, 2024
12024
A test vector selection method based on machine learning for efficient presilicon verification
HG Lim, J Jang, BK Ju, JW Ko, CO Kim
Expert Systems with Applications 224, 120056, 2023
12023
A deep learning-based conditional system health index method to reduce the uncertainty of remaining useful life prediction
J Jang
Soft Computing 27 (7), 3641-3654, 2023
12023
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Articles 1–20