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Thomas Huisman
Thomas Huisman
Researcher @ ASML
Verified email at asml.com
Title
Cited by
Cited by
Year
Femtosecond control of electric currents in metallic ferromagnetic heterostructures
TJ Huisman, RV Mikhaylovskiy, JD Costa, F Freimuth, E Paz, J Ventura, ...
Nature nanotechnology 11 (5), 455-458, 2016
2342016
Focusing light through random photonic media by binary amplitude modulation
D Akbulut, TJ Huisman, EG van Putten, WL Vos, AP Mosk
Optics express 19 (5), 4017-4029, 2011
2342011
Terahertz Magnon-Polaritons in TmFeO3
K Grishunin, T Huisman, G Li, E Mishina, T Rasing, AV Kimel, K Zhang, ...
ACS photonics 5 (4), 1375-1380, 2018
642018
Simultaneous measurements of terahertz emission and magneto-optical Kerr effect for resolving ultrafast laser-induced demagnetization dynamics
TJ Huisman, RV Mikhaylovskiy, A Tsukamoto, T Rasing, AV Kimel
Physical Review B 92 (10), 104419, 2015
642015
Programmable multiport optical circuits in opaque scattering materials
SR Huisman, TJ Huisman, TAW Wolterink, AP Mosk, PWH Pinkse
Optics express 23 (3), 3102-3116, 2015
522015
Spin-photo-currents generated by femtosecond laser pulses in a ferrimagnetic GdFeCo/Pt bilayer
TJ Huisman, C Ciccarelli, A Tsukamoto, RV Mikhaylovskiy, T Rasing, ...
Applied physics letters 110 (7), 2017
512017
Resonant Pumping of Crystal Field Electronic Transitions as a Mechanism of Ultrafast Optical Control of the Exchange Interactions in Iron Oxides
RV Mikhaylovskiy, TJ Huisman, VA Gavrichkov, SI Polukeev, ...
Physical review letters 125 (15), 157201, 2020
422020
Selective Excitation of Terahertz Magnetic and Electric Dipoles in Ions by Femtosecond Laser Pulses in
RV Mikhaylovskiy, TJ Huisman, RV Pisarev, T Rasing, AV Kimel
Physical review letters 118 (1), 017205, 2017
372017
THz emission spectroscopy for THz spintronics
TJ Huisman, T Rasing
Journal of the Physical Society of Japan 86 (1), 011009, 2017
362017
Terahertz magnetization dynamics induced by femtosecond resonant pumping of Dy 3+ subsystem in the multisublattice antiferromagnet DyFeO 3
RV Mikhaylovskiy, TJ Huisman, AI Popov, AK Zvezdin, T Rasing, ...
Physical Review B 92 (9), 094437, 2015
352015
Programming balanced optical beam splitters in white paint
SR Huisman, TJ Huisman, SA Goorden, AP Mosk, PWH Pinkse
Optics express 22 (7), 8320-8332, 2014
342014
Controlling single-photon Fock-state propagation through opaque scattering media
TJ Huisman, SR Huisman, AP Mosk, PWH Pinkse
Applied Physics B 116, 603-607, 2014
282014
Terahertz magneto-optics in the ferromagnetic semiconductor HgCdCr2Se4
TJ Huisman, RV Mikhaylovskiy, AV Telegin, YP Sukhorukov, ...
Applied Physics Letters 106 (13), 2015
272015
Sub-100-ps dynamics of the anomalous Hall effect at terahertz frequencies
TJ Huisman, RV Mikhaylovskiy, T Rasing, AV Kimel, A Tsukamoto, ...
Physical Review B 95 (9), 094418, 2017
192017
Terahertz dynamics of spins and charges in CoFe/Al 2 O 3 multilayers
JD Costa, TJ Huisman, RV Mikhaylovskiy, I Razdolski, J Ventura, ...
Physical Review B 91 (10), 104407, 2015
142015
Depth estimation from a single SEM image using pixel-wise fine-tuning with multimodal data
T Houben, T Huisman, M Pisarenco, F van der Sommen, PHN de With
Machine Vision and Applications 33 (4), 56, 2022
82022
Analyze line roughness sources using power spectral density (PSD)
L Pu, T Wang, TJ Huisman, R Maas, M Goosen, H Dillen, P Leray, W Fang
Metrology, Inspection, and Process Control for Microlithography XXXIII 10959 …, 2019
82019
Sem image enhancement methods and systems
W Fang, L Pu, TJ Huisman, EP Smakman
US Patent App. 16/508,087, 2020
72020
Understanding the influence of three-dimensional sidewall roughness on observed line-edge roughness in scanning electron microscopy images
L Van Kessel, T Huisman, CW Hagen
Journal of Micro/Nanolithography, MEMS, and MOEMS 19 (3), 034002-034002, 2020
42020
Training procedure for scanning electron microscope 3D surface reconstruction using unsupervised domain adaptation with simulated data
T Houben, T Huisman, M Pisarenco, F van der Sommen, P de With
Journal of Micro/Nanopatterning, Materials, and Metrology 22 (3), 031208-031208, 2023
32023
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