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A.  Maçarico
A. Maçarico
Adjunct Professor, Departement of Physics, Instituto Superior de Engenharia de Lisboa
Verified email at adf.isel.pt
Title
Cited by
Cited by
Year
Particle agglomeration study in rf silane plasmas: Insitu study by polarization‐sensitive laser light scattering
CH Courteille, C Hollenstein, JL Dorier, P Gay, W Schwarzenbach, ...
Journal of applied physics 80 (4), 2069-2078, 1996
1341996
Study of annealed indium tin oxide films prepared by rf reactive magnetron sputtering
L Meng, A Macarico, R Martins
Vacuum 46 (7), 673-680, 1995
1211995
Laser-scanned pin photodiode (LSP) for image detection
M Vieira, M Fernandes, J Martins, P Louro, AFRT Maçarico, R Schwarz, ...
IEEE Sensors Journal 1 (2), 158-167, 2001
682001
Highly conductive and highly transparent n-type microcrystalline silicon thin films
R Martins, A Macarico, I Ferreira, R Nunes, A Bicho, E Fortunato
Thin Solid Films 303 (1-2), 47-52, 1997
371997
Amorphous Silicon Technology
R Martins, L Ferreira, CN Carvalho, A Maçarico, L Guimarães
Department of Materials Science, Faculty of Science and Technology of New …, 1982
221982
Improved resolution in a pin image sensor by changing the structure of the doped layers
M Vieira, M Fernandes, J Martins, P Louro, A Maçarico, R Schwarz, ...
MRS Online Proceedings Library (OPL) 609, A14. 2, 2000
212000
In Amorphous and Heterogeneous Silicon Thin Films-2000
M Vieira, M Fernandes, J Martins, P Louro, A Maçarico, R Schwarz, ...
Mat. Res. Soc. Symp. Proc., S. Francisco (USA) 609, A14, 2000
182000
Tunneling in vertical μc Si/a SixCyOz: H/μc Si heterostructures
E Fortunato, R Martins, I Ferreira, M Santos, A Macarico, L Guimaraes
Journal of Non-Crystalline Solids 115 (1-3), 120-122, 1989
171989
Investigation of the amorphous to microcrystalline phase transition of thin film silicon produced by PECVD
R Martins, A Macarico, I Ferreira, R Nunes, A Bicho, E Fortunato
Thin Solid Films 317 (1-2), 144-148, 1998
161998
Transport in μc-Six: Cy: Oz: H films prepared by a TCDDC system
R Martins, G Willeke, E Fortunato, I Ferreira, M Vieira, M Santos, ...
Journal of Non-Crystalline Solids 114, 486-488, 1989
161989
14 th European Conference on Solid-State Transducers, Copenhagen (Denmark), August, 27-30, 2000
M Fernandes, P Louro, J Martins, A Maçarico, R Schwarz, M Vieira
in Sensors and Actuators A, 2000
142000
Effects of UV light on the transport properties of a-Si: H films during their growth
R Martins, N Carvalho, E Fortunato, A Maçarico, M Santos, I Baia, M Viera, ...
Journal of Non-Crystalline Solids 97, 1399-1402, 1987
131987
A two-dimensional visible/infrared detector based on μc-Si: H p–i–n structures
M Vieira, A Maçarico, E Morgado, S Koynov, R Schwarz
Journal of non-crystalline solids 227, 1311-1315, 1998
121998
Optoelectronic characterization of a-SIC: H stacked devices
P Louro, A Fantoni, M Fernandes, A Maçarico, R Schwarz, M Vieira
Journal of non-crystalline solids 338, 345-348, 2004
112004
Mat. Res. Soc. Symp. Proc.
M Vieira, M Fernandes, J Martins, P Louro, A Maçarico, R Schwarz, ...
Mat. Res. Soc. Symp. Proc 609, A14, 2000
112000
Spatially-resolved photocapacitance measurements to study defects in a-Si: H based p–i–n particle detectors
C Casteleiro, R Schwarz, U Mardolcar, A Maçarico, J Martins, M Vieira, ...
Thin Solid Films 516 (15), 5118-5121, 2008
102008
Image processing in a μc-Si: H p–i–n image transducer
F Sousa, J Martins, M Fernandes, A Maçarico, R Schwarz, M Vieira
Journal of Non-Crystalline Solids 266, 1228-1232, 2000
92000
VIS/NIR detector based on μc-Si: H p–i–n structures
M Fernandes, A Fantoni, J Martins, A Maçarico, R Schwarz, M Vieira
Thin solid films 364 (1-2), 204-208, 2000
82000
Radiation-induced defects in a-Si: H by 1.5 MeV He4 particles studied by photoconductivity and photothermal deflection spectroscopy
E Morgado, R Schwarz, T Braz, C Casteleiro, A Maçarico, M Vieira, ...
Journal of non-crystalline solids 352 (9-20), 1071-1074, 2006
72006
On the a-Si: H film growth: the role of the powder formation
A Maçarico, M Vieira, A Fantoni, P Louro, A Seco, R Martins, ...
Journal of non-crystalline solids 198, 1207-1211, 1996
71996
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