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Teng Yang
Teng Yang
SoC Design Engineer, Intel
Geverifieerd e-mailadres voor intel.com
Titel
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Jaar
Compact and supply-voltage-scalable temperature sensors for dense on-chip thermal monitoring
T Yang, S Kim, PR Kinget, M Seok
IEEE Journal of Solid-State Circuits 50 (11), 2773-2785, 2015
552015
14.7 In-situ techniques for in-field sensing of NBTI degradation in an SRAM register file
T Yang, D Kim, PR Kinget, M Seok
2015 IEEE International Solid-State Circuits Conference-(ISSCC) Digest of …, 2015
272015
An area-efficient microprocessor-based SoC with an instruction-cache transformable to an ambient temperature sensor and a physically unclonable function
J Li, T Yang, M Yang, PR Kinget, M Seok
IEEE Journal of Solid-State Circuits 53 (3), 728-737, 2018
262018
A 0.5 GHz–1.5 GHz order scalable harmonic rejection mixer
T Yang, K Tripurari, H Krishnaswamy, PR Kinget
2013 IEEE Radio frequency integrated circuits symposium (RFIC), 411-414, 2013
162013
Circuits, methods, and media for detecting and countering aging degradation in memory cells
M Seok, P Kinget, T Yang
US Patent 9,424,952, 2016
152016
A technique to transform 6T-SRAM arrays into robust analog PUF with minimal overhead
J Li, T Yang, M Seok
2017 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2017
122017
Circuits and methods for performing harmonic rejection mixing
K Tripurari, PR Kinget, H Krishnaswamy, T Yang
US Patent 9,455,757, 2016
122016
16.4 0.6-to-1.0V 279μm2, 0.92μW temperature sensor with less than +3.2/-3.4°C error for on-chip dense thermal monitoring
T Yang, S Kim, PR Kinget, M Seok
2014 IEEE International Solid-State Circuits Conference Digest of Technical …, 2014
102014
Register file circuits and post-deployment framework to monitor aging effects in field
T Yang, PR Kinget, M Seok
ESSCIRC Conference 2016: 42nd European Solid-State Circuits Conference, 425-428, 2016
82016
and In-Field Technique for Monitoring and Decelerating NBTI in 6T-SRAM Register Files
T Yang, D Kim, J Li, PR Kinget, M Seok
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 26 (11 …, 2018
72018
Recent advances in in-situ and in-field aging monitoring and compensation for integrated circuits
M Seok, PR Kinget, T Yang, J Li, D Kim
2018 IEEE International Reliability Physics Symposium (IRPS), 5C. 1-1-5C. 1-6, 2018
42018
An area-efficient microcontroller with an instruction-cache transformable to an ambient temperature sensor and a physically unclonable function
T Yang, J Li, M Yang, PR Kinget, M Seok
2017 IEEE Custom Integrated Circuits Conference (CICC), 1-4, 2017
42017
Compact and voltage-scalable sensor for accurate thermal sensing in dynamic thermal management
T Yang, PK Chundi, S Kim, E Kursun, M Kim, PR Kinget, M Seok
2017 IEEE 60th International Midwest Symposium on Circuits and Systems …, 2017
12017
In-situ and In-Field Temperature and Transistor BTI Sensing Techniques with Microprocessor Level Implementation
T Yang
Columbia University, 2022
2022
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T Yang, D Kim, J Li, PR Kinget, M Seok
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2241-2253, 2018
2018
Circuits, methods, and media for detecting and countering aging degradation in memory cells
M Seok, P Kinget, T Yang
US Patent App. 15/243,664, 2016
2016
Circuits for temperature monitoring
M Seok, PR Kinget, T Yang, S Kim
US Patent App. 15/033,858, 2016
2016
Self-Aware Computing for Cyber Physical Systems
M Seok, P Kinget, S Kim, T Yang
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Artikelen 1–18