Seyab Khan
Seyab Khan
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Comparison of reaction-diffusion and atomistic trap-based BTI models for logic gates
H Kükner, S Khan, P Weckx, P Raghavan, S Hamdioui, B Kaczer, ...
IEEE transactions on device and materials reliability 14 (1), 182-193, 2013
582013
Bias temperature instability analysis of FinFET based SRAM cells
S Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor
2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014
552014
BTI impact on logical gates in nano-scale CMOS technology
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2012 IEEE 15th International Symposium on Design and Diagnostics of …, 2012
452012
Trends and challenges of SRAM reliability in the nano-scale era
S Khan, S Hamdioui
5th International Conference on Design & Technology of Integrated Systems in …, 2010
392010
Modeling and mitigating NBTI in nanoscale circuits
S Khan, S Hamdioui
2011 IEEE 17th International On-Line Testing Symposium, 1-6, 2011
282011
Temperature dependence of NBTI induced delay
S Khan, S Hamdioui
2010 IEEE 16th International On-Line Testing Symposium, 15-20, 2010
272010
NBTI monitoring and design for reliability in nanoscale circuits
S Khan, NZ Haron, S Hamdioui, F Catthoor
2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2011
212011
BTI impact on SRAM sense amplifier
I Agbo, S Khan, S Hamdioui
2013 8th IEEE Design and Test Symposium, 1-6, 2013
162013
Incorporating parameter variations in BTI impact on nano-scale logical gates analysis
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2012 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2012
152012
Rate of healthcare worker–patient interaction and hand hygiene opportunities in an acute care setting
L Goodliffe, K Ragan, M Larocque, E Borgundvaag, S Khan, C Moore, ...
Infection Control & Hospital Epidemiology 35 (3), 225-230, 2014
142014
Impact of partial resistive defects and bias temperature instability on sram decoder reliablity
S Khan, M Taouil, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2013 8th IEEE Design and Test Symposium, 1-6, 2013
132013
Temperature impact on NBTI modeling in the framework of technology scaling
MS Khan, S Hamdioui
2nd HiPEAC Workshop on Design for Reliability 24, 2010
112010
Cotton jassid.
M Hasnain, MN Aslam, MA Sangi, S Khan
Cotton jassid., 2013
102013
Bias temperature instability analysis in SRAM decoder
S Khan, S Hamdioui, H Kukner, P Raghavan, F Catthoor
2013 18th IEEE European Test Symposium (ETS), 1-1, 2013
52013
NBTI Modeling in the Framework of Temperature Variation
S Khan, S Hamdioui
Proc. of Design and Test in Europe (DATE), 978-981, 2010
52010
Performance of precast ferrocement panel for composite masonry slab system
Y Yardim, MS Jafaar, J Noorzaei, SR Khan, NM Kamal
International Conference on Construction and Building Technology (ICCBT2008 …, 2008
52008
The varix of angular vein
SR Khan, BJL Burton, M Beaconsfield, GE Rose
Eye 18 (6), 645-647, 2004
52004
Effectiveness of sclerometer test technique on strength assessment of high performance concrete
SRM Khan, J Noorzaei, MRA Kadir, A Waleed, MS Jaafar
International Journal of Engineering and Technology 1 (2), 163-168, 2004
42004
Neuroimaging findings in children with rare or novel de novo chromosomal anomalies
LG Epstein, A Jalali, AN Chary, S Khan, J Ross, J Coppinger, K Carlson, ...
Birth Defects Research Part A: Clinical and Molecular Teratology 82 (4), 200-210, 2008
22008
Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits
MSK Seyab
12013
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Artikelen 1–20