Petr Cizmar
Petr Cizmar
GLOBALFOUNDRIES, Dresden, Germany
Verified email at cizmar.org
Title
Cited by
Cited by
Year
Handling and storage of human body fluids for analysis of extracellular vesicles
Y Yuana, AN Böing, AE Grootemaat, E van der Pol, CM Hau, P Cizmar, ...
Journal of extracellular vesicles 4 (1), 29260, 2015
1242015
Simulated SEM images for resolution measurement
P Cizmar, AE Vladár, B Ming, MT Postek, ...
Scanning 30 (5), 381-391, 2008
592008
Detection and characterization of extracellular vesicles by transmission and cryo-transmission electron microscopy
P Cizmar, Y Yuana
Extracellular Vesicles, 221-232, 2017
502017
Real-time scanning charged-particle microscope image composition with correction of drift
P Cizmar, AE Vladár, MT Postek
Microscopy and Microanalysis 17 (2), 302-308, 2011
36*2011
Inter-laboratory comparison on the size and stability of monodisperse and bimodal synthetic reference particles for standardization of extracellular vesicle measurements
A Nicolet, F Meli, E Van der Pol, Y Yuana, C Gollwitzer, M Krumrey, ...
Measurement Science and Technology 27 (3), 035701, 2016
202016
Can we get 3D-CD metrology right?
AE Vladár, P Cizmar, JS Villarrubia, MT Postek
Metrology, Inspection, and Process Control for Microlithography XXVI 8324 …, 2012
182012
Optimization of accurate SEM imaging by use of artificial images
P Cizmar, AE Vladár, MT Postek
Scanning Microscopy 2009 7378, 737815, 2009
162009
New multichannel electron energy analyzer with cylindrically symmetrical electrostatic field
P Cizmar, I Müllerová, M Jacka, A Pratt
Review of scientific instruments 78 (5), 053714, 2007
92007
Nanomanufacturing concerns about measurements made in the SEM Part III: vibration and drift
MT Postek, AE Vladár, P Cizmar
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and …, 2014
72014
Advances in modeling of scanning charged-particle-microscopy images
P Cizmar, AE Vladár, MT Postek
Scanning Microscopy 2010 7729, 77290Z, 2010
72010
Artificial SEM images for testing resolution-measurement methods
P Cizmar, AE Vladár, B Ming, MT Postek
Microscopy and Microanalysis 14 (S2), 910-911, 2008
62008
Advanced image composition with intra-frame drift correction
P Cizmar, AE Vladár, MT Postek
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense …, 2011
52011
Does your SEM really tell the truth? How would you know? part 3: vibration and drift
MT Postek, AE Vladár, P Cizmar
Scanning Microscopies 2014 9236, 923605, 2014
12014
Accurate and traceable dimensional metrology with a reference CD-SEM
AE Vladár, JS Villarrubia, P Cizmar, M Oral, MT Postek
Metrology, Inspection, and Process Control for Microlithography XXII 6922 …, 2008
12008
Simultaneous measurement of lateral and vertical size of nanoparticles using transmission scanning electron microscopy (TSEM)
E Buhr, MU Bug, D Bergmann, P Cizmar, CG Frase
Measurement Science and Technology 28 (3), 034002, 2017
2017
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and Semiconductors VII
MT Postek
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and …, 2013
2013
Novel Super-Fast Three-Dimensional SEM Image Simulation
P Cizmar, CG Frase, H Bosse
Microscopy and Microanalysis 19 (S2), 796-797, 2013
2013
QUANTITATIVE MULTI-SPECTRAL ANALYSIS OF PORTLAND CEMENT, FLY ASH AND SLAG USING SCANNING ELECTRON MICROSCOPY AND X-RAYż-ANALYSIS
PE Stutzman
2011
CHARACTERIZATION OF SOLID STATE LIGHTING PRODUCTS FOR MEASUREMENT INTERCOMPARISONS
CC Miller
2009
Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer Scale
AE Vladár, P Cizmar, MT Postek
Microscopy and Microanalysis 14 (S2), 118-119, 2008
2008
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Articles 1–20