Petr Cizmar
Petr Cizmar
GLOBALFOUNDRIES, Dresden, Germany
Verified email at cizmar.org
Title
Cited by
Cited by
Year
Handling and storage of human body fluids for analysis of extracellular vesicles
Y Yuana, AN Böing, AE Grootemaat, E van der Pol, CM Hau, P Cizmar, ...
Journal of extracellular vesicles 4 (1), 29260, 2015
1372015
Detection and characterization of extracellular vesicles by transmission and cryo-transmission electron microscopy
P Cizmar, Y Yuana
Extracellular Vesicles, 221-232, 2017
662017
Simulated SEM images for resolution measurement
P Cizmar, AE Vladár, B Ming, MT Postek, ...
Scanning 30 (5), 381-391, 2008
632008
Real-time scanning charged-particle microscope image composition with correction of drift
P Cizmar, AE Vladár, MT Postek
Microscopy and Microanalysis 17 (2), 302-308, 2011
37*2011
Inter-laboratory comparison on the size and stability of monodisperse and bimodal synthetic reference particles for standardization of extracellular vesicle measurements
A Nicolet, F Meli, E Van der Pol, Y Yuana, C Gollwitzer, M Krumrey, ...
Measurement Science and Technology 27 (3), 035701, 2016
202016
Optimization of accurate SEM imaging by use of artificial images
P Cizmar, AE Vladár, MT Postek
Scanning Microscopy 2009 7378, 737815, 2009
192009
Can we get 3D-CD metrology right?
AE Vladár, P Cizmar, JS Villarrubia, MT Postek
Metrology, Inspection, and Process Control for Microlithography XXVI 8324 …, 2012
182012
New multichannel electron energy analyzer with cylindrically symmetrical electrostatic field
P Cizmar, I Müllerová, M Jacka, A Pratt
Review of scientific instruments 78 (5), 053714, 2007
92007
Nanomanufacturing concerns about measurements made in the SEM Part III: vibration and drift
MT Postek, AE Vladár, P Cizmar
Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and …, 2014
72014
Advances in modeling of scanning charged-particle-microscopy images
P Cizmar, AE Vladár, MT Postek
Scanning Microscopy 2010 7729, 77290Z, 2010
72010
Artificial SEM images for testing resolution-measurement methods
P Cizmar, AE Vladár, B Ming, MT Postek
Microscopy and Microanalysis 14 (S2), 910-911, 2008
62008
Advanced image composition with intra-frame drift correction
P Cizmar, AE Vladár, MT Postek
Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense …, 2011
52011
Accurate and traceable dimensional metrology with a reference CD-SEM
AE Vladár, JS Villarrubia, P Cizmar, M Oral, MT Postek
Metrology, Inspection, and Process Control for Microlithography XXII 6922 …, 2008
22008
Simultaneous measurement of lateral and vertical size of nanoparticles using transmission scanning electron microscopy (TSEM)
E Buhr, MU Bug, D Bergmann, P Cizmar, CG Frase
Measurement Science and Technology 28 (3), 034002, 2017
12017
Does your SEM really tell the truth? How would you know? part 3: vibration and drift
MT Postek, AE Vladár, P Cizmar
Scanning Microscopies 2014 9236, 923605, 2014
12014
Novel Super-Fast Three-Dimensional SEM Image Simulation
P Cizmar, CG Frase, H Bosse
Microscopy and Microanalysis 19 (S2), 796-797, 2013
2013
Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer Scale
AE Vladár, P Cizmar, MT Postek
Microscopy and Microanalysis 14 (S2), 118-119, 2008
2008
Accurate and traceable dimensional metrology with a reference CD-SEM [6922-16]
AE Vladar, JS Villarrubia, P Cizmar, M Oral, MT Postek
PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING 6922 (1 …, 2008
2008
Conference 8324: Metrology, Inspection, and Process Control for Microlithography XXVI
AE Vladár, P Cizmar, JS Villarrubia, MT Postek
Technical Summaries 6, 66, 0
The system can't perform the operation now. Try again later.
Articles 1–19