Handling and storage of human body fluids for analysis of extracellular vesicles Y Yuana, AN Böing, AE Grootemaat, E van der Pol, CM Hau, P Cizmar, ... Journal of extracellular vesicles 4 (1), 29260, 2015 | 206 | 2015 |
Detection and characterization of extracellular vesicles by transmission and cryo-transmission electron microscopy P Cizmar, Y Yuana Extracellular vesicles: methods and protocols, 221-232, 2017 | 153 | 2017 |
Simulated SEM images for resolution measurement P Cizmar, AE Vladár, B Ming, MT Postek, ... Scanning 30 (5), 381-391, 2008 | 74 | 2008 |
Real-time scanning charged-particle microscope image composition with correction of drift P Cizmar, AE Vladár, MT Postek Microscopy and Microanalysis 17 (2), 302-308, 2011 | 40 | 2011 |
Optimization of accurate SEM imaging by use of artificial images P Cizmar, AE Vladár, MT Postek Scanning Microscopy 2009 7378, 208-213, 2009 | 26 | 2009 |
Inter-laboratory comparison on the size and stability of monodisperse and bimodal synthetic reference particles for standardization of extracellular vesicle measurements A Nicolet, F Meli, E Van der Pol, Y Yuana, C Gollwitzer, M Krumrey, ... Measurement Science and Technology 27 (3), 035701, 2016 | 24 | 2016 |
Can we get 3D-CD metrology right? AE Vladár, P Cizmar, JS Villarrubia, MT Postek Metrology, Inspection, and Process Control for Microlithography XXVI 8324, 23-35, 2012 | 19 | 2012 |
New multichannel electron energy analyzer with cylindrically symmetrical electrostatic field P Cizmar, I Müllerová, M Jacka, A Pratt Review of scientific instruments 78 (5), 2007 | 9 | 2007 |
Extracellular Vesicles P Cizmar, Y Yuana Springer, 2017 | 7 | 2017 |
Nanomanufacturing concerns about measurements made in the SEM Part III: vibration and drift MT Postek, AE Vladár, P Cizmar Instrumentation, Metrology, and Standards for Nanomanufacturing, Optics, and …, 2014 | 7 | 2014 |
Advances in modeling of scanning charged-particle-microscopy images P Cizmar, AE Vladár, MT Postek Scanning Microscopy 2010 7729, 173-181, 2010 | 7 | 2010 |
Artificial SEM images for testing resolution-measurement methods P Cizmar, AE Vladár, B Ming, MT Postek Microscopy and Microanalysis 14 (S2), 910-911, 2008 | 6 | 2008 |
Advanced image composition with intra-frame drift correction P Cizmar, AE Vladár, MT Postek Scanning Microscopies 2011: Advanced Microscopy Technologies for Defense …, 2011 | 5 | 2011 |
Simultaneous measurement of lateral and vertical size of nanoparticles using transmission scanning electron microscopy (TSEM) E Buhr, MU Bug, D Bergmann, P Cizmar, CG Frase Measurement Science and Technology 28 (3), 034002, 2017 | 3 | 2017 |
Does your SEM really tell the truth? How would you know? part 3: vibration and drift MT Postek, AE Vladár, P Cizmar Scanning Microscopies 2014 9236, 20-29, 2014 | 3 | 2014 |
Accurate and traceable dimensional metrology with a reference CD-SEM AE Vladár, JS Villarrubia, P Cizmar, M Oral, MT Postek Metrology, Inspection, and Process Control for Microlithography XXII 6922 …, 2008 | 2 | 2008 |
Novel Super-Fast Three-Dimensional SEM Image Simulation P Cizmar, CG Frase, H Bosse Microscopy and Microanalysis 19 (S2), 796-797, 2013 | | 2013 |
Scanning Electron and Ion Microscope-based Size and Shape Metrology at the Nanometer Scale AE Vladár, P Cizmar, MT Postek Microscopy and Microanalysis 14 (S2), 118-119, 2008 | | 2008 |
Accurate and traceable dimensional metrology with a reference CD-SEM [6922-16] AE Vladar, JS Villarrubia, P Cizmar, M Oral, MT Postek PROCEEDINGS-SPIE THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING 6922 (1 …, 2008 | | 2008 |
Conference 8324: Metrology, Inspection, and Process Control for Microlithography XXVI AE Vladár, P Cizmar, JS Villarrubia, MT Postek Technical Summaries 6, 66, 0 | | |