Mark Schulze
Mark Schulze
Self-employed
Verified email at alumni.rice.edu - Homepage
Title
Cited by
Cited by
Year
System and method for acquiring and processing complex images
X Dai, A El-Khashab, M Hunt, M Schulze, C Thomas, E Voelkl
US Patent App. 10/661,187, 2004
472004
A morphology-based filter structure for edge-enhancing smoothing
MA Schulze, JA Pearce
Proceedings of 1st International Conference on Image Processing 2, 530-534, 1994
441994
Noise reduction in synthetic aperture radar imagery using a morphology-based nonlinear filter
MA Schulze, QX Wu
Proceedings of Digital Image Computing: Techniques and Applications, 661-666, 1995
381995
Blue noise and model-based halftoning
MA Schulze, TN Pappas
Human Vision, Visual Processing, and Digital Display V 2179, 182-194, 1994
361994
Simplified design of steerable pyramid filters
KR Castleman, M Schulze, Q Wu
ISCAS'98. Proceedings of the 1998 IEEE International Symposium on Circuits …, 1998
351998
Semiconductor wafer defect detection using digital holography
MA Schulze, MA Hunt, E Voelkl, JD Hickson, WR Usry, RG Smith, ...
Process and Materials Characterization and Diagnostics in IC Manufacturing …, 2003
292003
Linear combinations of morphological operators: The midrange, pseudomedian, and LOCO filters
MA Schulze, JA Pearce
1993 IEEE International Conference on Acoustics, Speech, and Signal …, 1993
291993
Classification accuracy in multiple color fluorescence imaging microscopy
KR Castleman, R Eils, L Morrison, J Piper, K Saracoglu, MA Schulze, ...
Cytometry: The Journal of the International Society for Analytical Cytology …, 2000
272000
Nonlinear edge-preserving smoothing of synthetic aperture radar images
MA Schulze, QX Wu
Proc. of the New Zealand Image and Vision Computing’95 Workshop, 28-29, 1995
241995
Edge-enhancing nonlinear filter for reducing multiplicative noise
MA Schulze
Nonlinear Image Processing VIII 3026, 46-56, 1997
231997
Direct to digital holography for semiconductor wafer defect detection and review
CE Thomas Jr, TM Bahm, LR Baylor, PR Bingham, SW Burns, M Chidley, ...
Design, Process Integration, and Characterization for Microelectronics 4692 …, 2002
222002
Direct to digital holography for semiconductor wafer defect detection and review
CE Thomas Jr, TM Bahm, LR Baylor, PR Bingham, SW Burns, M Chidley, ...
Design, Process Integration, and Characterization for Microelectronics 4692 …, 2002
222002
Steerable pyramid filters for selective image enhancement applications
Q Wu, MA Schulze, KR Castleman
ISCAS'98. Proceedings of the 1998 IEEE International Symposium on Circuits …, 1998
221998
System and method for a vector difference mean filter for noise suppression
M Schulze, G John
US Patent App. 10/992,409, 2006
212006
Biomedical image processing with morphology-based nonlinear filters.
MA Schulze
211996
Direct to digital holography for high aspect ratio inspection of semiconductor wafers
CE Thomas Jr, MA Hunt, TM Bahm, LR Baylor, PR Bingham, MD Chidley, ...
AIP Conference Proceedings 683 (1), 254-270, 2003
192003
Linear programming for optimization
MA Schulze
Perspective Scientific Instruments Inc, 1998
191998
Value-and-criterion filters: a new filter structure based on morphological opening and closing
MA Schulze, JA Pearce
Nonlinear Image Processing IV 1902, 106-115, 1993
141993
Some properties of the two-dimensional pseudomedian filter
MA Schulze, JA Pearce
Nonlinear Image Processing II 1451, 48-57, 1991
131991
CE (Tommy) Thomas Jr
MA Schulze, MA Hunt, E Voelkl, JD Hickson, W Usry, RG Smith, R Bryant
Semiconductor wafer defect detection using digital holography, Process and …, 2003
92003
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