| Device-Aware Test: A New test Approach Towards DPPB Level M Fieback, L Wu, GC Medeiros, H Aziza, S Rao, EJ Marinissen, M Taouil, ... 2019 IEEE International Test Conference (ITC), 1-10, 2019 | 59 | 2019 |
| Pinhole Defect Characterization and Fault Modeling for STT-MRAM Testing L Wu, S Rao, GC Medeiros, M Taouil, EJ Marinissen, F Yasin, S Couet, ... 2019 IEEE European Test Symposium (ETS), 1-6, 2019 | 28 | 2019 |
| Defect and Fault Modeling Framework for STT-MRAM Testing L Wu, S Rao, M Taouil, GC Medeiros, M Fieback, EJ Marinissen, GS Kar, ... IEEE Transactions on Emerging Topics in Computing, 2019 | 25 | 2019 |
| Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits M Jenihhin, G Squillero, TS Copetti, V Tihhomirov, S Kostin, M Gaudesi, ... Journal of Electronic Testing 32 (3), 273-289, 2016 | 23 | 2016 |
| Intermittent Undefined State Fault in RRAMs M Fieback, GC Medeiros, A Gebregiorgis, H Aziza, M Taouil, S Hamdioui 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 22 | 2021 |
| Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations AF Gomez, F Lavratti, G Medeiros, M Sartori, LB Poehls, V Champac, ... Microelectronics Reliability 67, 150-158, 2016 | 16 | 2016 |
| DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs GC Medeiros, M Taouil, M Fieback, LB Poehls, S Hamdioui 2019 IEEE European Test Symposium (ETS), 1-2, 2019 | 14 | 2019 |
| Analyzing the behavior of FinFET SRAMs with resistive defects TS Copetti, TR Balen, GC Medeiros, LMB Poehls 2017 IFIP/IEEE International Conference on Very Large Scale Integration …, 2017 | 14 | 2017 |
| Hard-to-Detect Fault Analysis in FinFET SRAMs GC Medeiros, M Fieback, L Wu, M Taouil, LMB Poehls, S Hamdioui IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2021 | 11 | 2021 |
| Analyzing NBTI impact on SRAMs with resistive-open defects MT Martins, G Medeiros, T Copetti, F Vargas, LB Poehls 2016 17th Latin-American Test Symposium (LATS), 87-92, 2016 | 9 | 2016 |
| A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs GC Medeiros, LMB Poehls, M Taouil, FL Vargas, S Hamdioui Microelectronics Reliability 88, 355-359, 2018 | 8 | 2018 |
| A DFT Scheme to Improve Coverage of Hard-to-Detect Faults in FinFET SRAMs GC Medeiros, CC Gürsoy, L Wu, M Fieback, M Jenihhin, M Taouil, ... 2020 Design, Automation & Test in Europe Conference & Exhibition (DATE), 792-797, 2020 | 7 | 2020 |
| Analysing NBTI Impact on SRAMs with Resistive Defects MT Martins, GC Medeiros, T Copetti, FL Vargas, LMB Poehls Journal of Electronic Testing 33 (5), 637-655, 2017 | 6 | 2017 |
| Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects GC Medeiros, LB Poehls, FF Vargas 2016 29th International Conference on VLSI Design and 2016 15th …, 2016 | 6 | 2016 |
| Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects GC Medeiros, E Brum, LB Poehls, T Copetti, T Balen Journal of Electronic Testing 35 (2), 191-200, 2019 | 5 | 2019 |
| Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs G Medeiros, E Brum, LB Poehls, T Copetti, T Balen 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018 | 5 | 2018 |
| Gate-level modelling of NBTI-induced delays under process variations T Copetti, G Medeiros, LB Poehls, F Vargas, S Kostin, M Jenihhin, J Raik, ... 2016 17th Latin-American Test Symposium (LATS), 75-80, 2016 | 5 | 2016 |
| Detecting random read faults to reduce test escapes in FinFET SRAMs GC Medeiros, M Fieback, A Gebregiorgis, M Taouil, LB Poehls, ... 2021 IEEE European Test Symposium (ETS), 1-6, 2021 | 4 | 2021 |
| Evaluating the Impact of Ionizing Particles on FinFET-based SRAMs with Weak Resistive Defects T Copetti, GC Medeiros, M Taouil, S Hamdioui, LB Poehls, T Balen 2020 IEEE Latin-American Test Symposium (LATS), 1-6, 2020 | 4 | 2020 |
| Modeling Soft-Error Reliability Under Variability A Balakrishnan, GC Medeiros, CC Gürsoy, S Hamdioui, M Jenihhin, ... 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2021 | 3 | 2021 |
Said HamdiouiDelft University of TechnologyE-mail confirmado em tudelft.nl
