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Bartosz Such
Bartosz Such
Uniwersytet Jagielloński, Wydział Fizyki, Astronomii i Informatyki Stosowanej
Verified email at uj.edu.pl
Title
Cited by
Cited by
Year
Systematic achievement of improved atomic-scale contrast via bimodal dynamic force microscopy
S Kawai, T Glatzel, S Koch, B Such, A Baratoff, E Meyer
Physical review letters 103 (22), 220801, 2009
1502009
Nonacene generated by on-surface dehydrogenation
R Zuzak, R Dorel, M Krawiec, B Such, M Kolmer, M Szymonski, ...
ACS nano 11 (9), 9321-9329, 2017
1122017
Ultrasensitive detection of lateral atomic-scale interactions on graphite (0001) via bimodal dynamic force measurements
S Kawai, T Glatzel, S Koch, B Such, A Baratoff, E Meyer
Physical Review B 81 (8), 085420, 2010
962010
Atomic-resolution images of radiation damage in KBr
R Bennewitz, S Schär, V Barwich, O Pfeiffer, E Meyer, F Krok, B Such, ...
Surface science 474 (1-3), L197-L202, 2001
832001
Polymerization of polyanthrylene on a titanium dioxide (011)-(2× 1) surface.
M Kolmer, AA Ahmad Zebari, JS Prauzner-Bechcicki, W Piskorz, F Zasada, ...
Angewandte Chemie 125 (39), 2013
722013
Nano-scale modification of ionic surfaces induced by electronic transitions
M Szymonski, J Kolodziej, B Such, P Piatkowski, P Struski, P Czuba, ...
Progress in Surface Science 67 (1-8), 123-138, 2001
622001
Functionalized truxenes: adsorption and diffusion of single molecules on the KBr (001) surface
B Such, T Trevethan, T Glatzel, S Kawai, L Zimmerli, E Meyer, AL Shluger, ...
ACS nano 4 (6), 3429-3439, 2010
592010
Surface topography dependent desorption of alkali halides
B Such, J Kolodziej, P Czuba, P Piatkowski, P Struski, F Krok, ...
Physical Review Letters 85 (12), 2621, 2000
592000
AFM studies of electron-stimulated desorption process of KBr (001) surface
B Such, P Czuba, P Piatkowski, M Szymonski
Surface science 451 (1-3), 203-207, 2000
572000
Atomic structure of InSb (001) and GaAs (001) surfaces imaged with noncontact atomic force microscopy
JJ Kolodziej, B Such, M Szymonski, F Krok
Physical review letters 90 (22), 226101, 2003
502003
Electronic properties of STM-constructed dangling-bond dimer lines on a Ge(001)-(21):H surface
M Kolmer, S Godlewski, H Kawai, B Such, F Krok, M Saeys, C Joachim, ...
Physical Review B 86 (12), 125307, 2012
472012
Determination of effective tip geometries in Kelvin probe force microscopy on thin insulating films on metals
T Glatzel, L Zimmerli, S Koch, B Such, S Kawai, E Meyer
Nanotechnology 20 (26), 264016, 2009
432009
Organic molecules reconstruct nanostructures on ionic surfaces
T Trevethan, B Such, T Glatzel, S Kawai, AL Shluger, E Meyer, ...
Small 7 (9), 1264-1270, 2011
402011
Frenkel defect interactions at surfaces of irradiated alkali halides studied by non-contact atomic-force microscopy
JJ Kolodziej, B Such, P Czuba, F Krok, P Piatkowski, P Struski, ...
Surface science 482, 903-909, 2001
402001
Self-assembling of Zn porphyrins on a (110) face of rutile TiO2–The anchoring role of carboxyl groups
L Zajac, P Olszowski, S Godlewski, L Bodek, B Such, R Jöhr, R Pawlak, ...
Applied Surface Science 379, 277-281, 2016
362016
Contacting a conjugated molecule with a surface dangling bond dimer on a hydrogenated ge (001) surface allows imaging of the hidden ground electronic state
S Godlewski, M Kolmer, H Kawai, B Such, R Zuzak, M Saeys, ...
ACS nano 7 (11), 10105-10111, 2013
342013
Characterization of individual molecular adsorption geometries by atomic force microscopy: Cu-TCPP on rutile TiO2 (110)
R Jöhr, A Hinaut, R Pawlak, A Sadeghi, S Saha, S Goedecker, B Such, ...
The Journal of chemical physics 143 (9), 2015
312015
Dynamic force microscopy and Kelvin probe force microscopy of KBr film on InSb (001) surface at submonolayer coverage
F Krok, JJ Kolodziej, B Such, P Czuba, P Struski, P Piatkowski, ...
Surface science 566, 63-67, 2004
302004
Hydroxyl-induced partial charge states of single porphyrins on titania rutile
R Pawlak, A Sadeghi, R Jöhr, A Hinaut, T Meier, S Kawai, Ł Zajac, ...
The Journal of Physical Chemistry C 121 (6), 3607-3614, 2017
292017
Surface structure investigations using noncontact atomic force microscopy
JJ Kolodziej, B Such, M Goryl, F Krok, P Piatkowski, M Szymonski
Applied surface science 252 (21), 7614-7623, 2006
292006
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