Ivan Lazić
Ivan Lazić
Senior Scientist at Thermo Fisher Scientific, The Netherlands
Geverifieerd e-mailadres voor thermofisher.com
Geciteerd door
Geciteerd door
Phase contrast STEM for thin samples: Integrated differential phase contrast
I Lazić, EGT Bosch, S Lazar
Ultramicroscopy 160, 265-280, 2016
Phase contrast scanning transmission electron microscopy imaging of light and heavy atoms at the limit of contrast and resolution
E Yücelen, I Lazić, EGT Bosch
Scientific reports 8 (1), 2676, 2018
Image formation modeling in cryo-electron microscopy
M Vulović, RBG Ravelli, LJ van Vliet, AJ Koster, I Lazić, U Lücken, ...
Journal of structural biology 183 (1), 19-32, 2013
Revisiting the Al/Al2O3 Interface: Coherent Interfaces and Misfit Accommodation
G Pilania, BJ Thijsse, RG Hoagland, I Lazić, SM Valone, XY Liu
Scientific reports 4 (1), 4485, 2014
A single-molecule van der Waals compass
B Shen, X Chen, H Wang, H Xiong, EGT Bosch, I Lazić, D Cai, W Qian, ...
Nature 592 (7855), 541-544, 2021
Analytical review of direct STEM imaging techniques for thin samples
I Lazić, EGT Bosch
Advances in Imaging and Electron Physics 199, 75-184, 2017
Atomic imaging of zeolite-confined single molecules by electron microscopy
B Shen, H Wang, H Xiong, X Chen, EGT Bosch, I Lazić, W Qian, F Wei
Nature 607, 703-707, 2022
Visualization of Dopant Oxygen Atoms in a Bi2Sr2CaCu2O8+ δ Superconductor
D Song, X Zhang, C Lian, H Liu, I Alexandrou, I Lazić, EGT Bosch, ...
Advanced Functional Materials, 1903843, 2019
Analysis of HR-STEM theory for thin specimen
EGT Bosch, I Lazić
Ultramicroscopy 156, 59-72, 2015
Method of preparing and imaging a lamella in a particle-optical apparatus
BR Routh, PC Tiemeijer, BJ Janssen, TG Miller, D Foord, I Lazić
US Patent 8,766,214, 2014
Ultrahigh resolution focused electron beam induced processing: the effect of substrate thickness
WF van Dorp, I Lazić, A Beyer, A Gölzhäuser, JB Wagner, TW Hansen, ...
Nanotechnology 22 (11), 115303, 2011
Analysis of depth-sectioning STEM for thick samples and 3D imaging
EGT Bosch, I Lazić
Ultramicroscopy 207, 112831, 2019
Single-particle cryo-EM structures from iDPC–STEM at near-atomic resolution
I Lazić, M Wirix, ML Leidl, F de Haas, M Beckers, EV Pechnikova, ...
Nature Methods 19, 1126–1136, 2022
An improved molecular dynamics potential for the Al–O system
I Lazić, BJ Thijsse
Computational materials science 53 (1), 483-492, 2012
Method of examining a sample in a charged-particle microscope
I Lazić, EGT Bosch, F Boughorbel, B Buijsse, K Sader, S Lazar
US Patent 9,312,098, 2016
Imaging biological samples by integrated differential phase contrast (iDPC) STEM technique
X Li, I Lazić, X Huang, M Wirix, L Wang, Y Deng, T Niu, D Wu, L Yu, F Sun
Journal of Structural Biology 214 (1), 107837, 2022
Integrated Differential Phase Contrast (iDPC) STEM: A New Atomic Resolution STEM Technique To Image All Elements Across the Periodic Table
EGT Bosch, I Lazić, S Lazar
Microscopy and Microanalysis 22 (S3), 306-307, 2016
Integrated Differential Phase Contrast (iDPC)–Direct Phase Imaging in STEM for Thin Samples
I Lazić, EGT Bosch, S Lazar, M Wirix, E Yücelen
Microscopy and Microanalysis 22 (S3), 36-37, 2016
Scanning electron microscopy of individual nanoparticle bio-markers in liquid
N Liv, I Lazić, P Kruit, JP Hoogenboom
Ultramicroscopy 143, 93-99, 2014
Method of investigating the wavefront of a charged-particle beam
BJ Janssen, G Van Duinen, U Luecken, R Savage, SHL van den Boom, ...
US Patent 9,202,670, 2015
Het systeem kan de bewerking nu niet uitvoeren. Probeer het later opnieuw.
Artikelen 1–20