Youngju Kim
Youngju Kim
Staff engineer in Samsung Electronics, South Korea
Verified email at
Cited by
Cited by
A deep learning model for robust wafer fault monitoring with sensor measurement noise
H Lee, Y Kim, CO Kim
IEEE Transactions on Semiconductor Manufacturing 30 (1), 23-31, 2016
A variational autoencoder for a semiconductor fault detection model robust to process drift due to incomplete maintenance
Y Kim, H Lee, CO Kim
Journal of Intelligent Manufacturing, 1-12, 2021
A modified lasso model for yield analysis considering the interaction effect in a multistage manufacturing line
T Heo, Y Kim, CO Kim
IEEE Transactions on Semiconductor Manufacturing 35 (1), 32-39, 2021
Discovery of fault-introducing tool groups with a numerical association rule mining method in a printed circuit board production line
Y Lee, Y Kim, B Lee, CO Kim
International Journal of Production Research, 1-15, 2023
Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits
HS Shin, Y Kim, CO Kim, SH Park
Expert Systems with Applications 202, 117341, 2022
The system can't perform the operation now. Try again later.
Articles 1–5