| A deep learning model for robust wafer fault monitoring with sensor measurement noise H Lee, Y Kim, CO Kim IEEE Transactions on Semiconductor Manufacturing 30 (1), 23-31, 2016 | 118 | 2016 |
| A variational autoencoder for a semiconductor fault detection model robust to process drift due to incomplete maintenance Y Kim, H Lee, CO Kim Journal of Intelligent Manufacturing, 1-12, 2021 | 18 | 2021 |
| Discovery of fault-introducing tool groups with a numerical association rule mining method in a printed circuit board production line Y Lee, Y Kim, B Lee, CO Kim International Journal of Production Research, 1-15, 2023 | 2 | 2023 |
| A modified lasso model for yield analysis considering the interaction effect in a multistage manufacturing line T Heo, Y Kim, CO Kim IEEE Transactions on Semiconductor Manufacturing 35 (1), 32-39, 2021 | 2 | 2021 |
| Unsupervised novelty pattern classification of shmoo plots for visualizing the test results of integrated circuits HS Shin, Y Kim, CO Kim, SH Park Expert Systems with Applications 202, 117341, 2022 | | 2022 |
