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Jiarui Mo
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Surface-micromachined silicon carbide Pirani gauges for harsh environments
J Mo, LM Middelburg, B Morana, HW Van Zeijl, S Vollebregt, G Zhang
IEEE Sensors journal 21 (2), 1350-1358, 2020
212020
A highly linear temperature sensor operating up to 600 c in a 4h-sic cmos technology
J Mo, J Li, Y Zhang, J Romijn, A May, T Erlbacher, G Zhang, S Vollebregt
IEEE Electron Device Letters, 2023
152023
Investigating Mechanical Properties of Silicon Carbide Coated Carbon Nanotube Composite at Elevated Temperatures
J Mo, GJK Schaffar, L Du, V Maier-Kiener, D Kiener, S Vollebregt, ...
2024 IEEE 37th International Conference on Micro Electro Mechanical Systems …, 2024
12024
Electromigration-induced local dewetting in Cu films
Y Zhang, J Mo, Z Cui, S Vollebregt, G Zhang
2023 IEEE International Interconnect Technology Conference (IITC) and IEEE …, 2023
12023
Silicon carbide-on-insulator thermal-piezoresistive resonator for harsh environment application
B Sun, J Mo, H Zhang, HW van Zeijl, WD van Driel, G Zhang
2023 IEEE 36th International Conference on Micro Electro Mechanical Systems …, 2023
12023
Silicon carbide reinforced vertically aligned carbon nanotube composite for harsh environment mems
J Mo, S Shankar, G Zhang, S Vollebregt
2023 IEEE 36th International Conference on Micro Electro Mechanical Systems …, 2023
12023
An analog to digital converter in a SiC CMOS technology for high-temperature applications
J Mo, Y Niu, A May, M Rommel, C Rossi, J Romijn, G Zhang, S Vollebregt
Applied Physics Letters 124 (15), 2024
2024
A high aspect ratio surface micromachined accelerometer based on a SiC-CNT composite material
J Mo, S Shankar, R Pezone, G Zhang, S Vollebregt
Microsystems & Nanoengineering 10 (1), 42, 2024
2024
A Fully Integrated Sequential Synchronized Switch Harvesting on Capacitors Rectifier Based on Split-Electrode for Piezoelectric Energy Harvesting
X Yue, J Mo, Z Chen, S Vollebregt, G Zhang, S Du
IEEE Transactions on Power Electronics, 2024
2024
Design and Characterization of a Data Converter in a SiC CMOS Technology for Harsh Environment Sensing Applications
Y Niu, J Mo, A May, M Rommel, C Rossi, J Romijn, G Zhang, S Vollebregt
2023 IEEE SENSORS, 1-4, 2023
2023
Time-Dependent Dielectric Breakdown of 4H-SiC MOSFETs in CMOS Technology
Y Zhang, J Mo, S Vollebregt, G Zhang, A May, T Erlbacher
2023 24th International Conference on Electronic Packaging Technology (ICEPT …, 2023
2023
Modelling, Design, and Fabrication of High-Temperature Compatible Vacuum Gauges in Silicon Carbide
J Mo
2019
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