| Bias temperature instability analysis of FinFET based SRAM cells S Khan, I Agbo, S Hamdioui, H Kukner, B Kaczer, P Raghavan, F Catthoor 2014 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2014 | 63 | 2014 |
| Integral impact of BTI, PVT variation, and workload on SRAM sense amplifier I Agbo, M Taouil, D Kraak, S Hamdioui, H Kükner, P Weckx, P Raghavan, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (4 …, 2017 | 41 | 2017 |
| Quantification of sense amplifier offset voltage degradation due to zero-and run-time variability I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, P Raghavan, ... 2016 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 725-730, 2016 | 23 | 2016 |
| BTI impact on SRAM sense amplifier I Agbo, S Khan, S Hamdioui 2013 8th IEEE Design and Test Symposium, 1-6, 2013 | 23 | 2013 |
| Mitigation of sense amplifier degradation using input switching D Kraak, I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor, ... Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 22 | 2017 |
| Impact and mitigation of sense amplifier aging degradation using realistic workloads D Kraak, M Taouil, I Agbo, S Hamdioui, P Weckx, S Cosemans, F Catthoor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (12 …, 2017 | 21 | 2017 |
| Integral impact of BTI and voltage temperature variation on SRAM sense amplifier I Agbo, M Taouil, S Hamdioui, H Kukner, P Weckx, P Raghavan, ... 2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015 | 20 | 2015 |
| Comparative BTI analysis for various sense amplifier designs I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, P Raghavan, ... 2016 IEEE 19th International Symposium on Design and Diagnostics of …, 2016 | 15 | 2016 |
| BTI analysis of SRAM write driver I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor 2015 10th International Design & Test Symposium (IDT), 100-105, 2015 | 14 | 2015 |
| Degradation analysis of high performance 14nm finfet sram D Kraak, I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor 2018 Design, Automation & Test in Europe Conference & Exhibition (DATE), 201-206, 2018 | 13 | 2018 |
| Read path degradation analysis in SRAM I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor, ... 2016 21th IEEE European Test Symposium (ETS), 1-2, 2016 | 13 | 2016 |
| Parametric and functional degradation analysis of complete 14-nm FinFET SRAM D Kraak, M Taouil, I Agbo, S Hamdioui, P Weckx, S Cosemans, F Catthoor IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (6 …, 2019 | 12 | 2019 |
| Hardware-based aging mitigation scheme for memory address decoder D Kraak, I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor 2019 IEEE European Test Symposium (ETS), 1-6, 2019 | 8 | 2019 |
| Impact and mitigation of SRAM read path aging I Agbo, M Taouil, D Kraak, S Hamdioui, P Weckx, S Cosemans, F Catthoor, ... Microelectronics Reliability 87, 158-167, 2018 | 7 | 2018 |
| Methodology for application-dependent degradation analysis of memory timing D Kraak, I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, F Catthoor 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE), 162-167, 2019 | 5 | 2019 |
| Implementable building blocks for fluctuation based calculation in single electron tunneling technology I Agbo, S Safiruddin, S Cotofana 2009 9th IEEE Conference on Nanotechnology (IEEE-NANO), 366-369, 2009 | 5 | 2009 |
| Software-based mitigation for memory address decoder aging DHP Kraak, CC Gürsoy, IO Agbo, M Taouil, M Jenihhin, J Raik, ... 2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019 | 4 | 2019 |
| Comparative analysis of rd and atomistic trap-based bti models on sram sense amplifier I Agbo, M Taouil, S Hamdioui, S Cosemans, P Weckx, P Raghavan, ... 2015 10th International Conference on Design & Technology of Integrated …, 2015 | 4 | 2015 |
| Comparative BTI impact for SRAM cell and sense amplifier designs I Agbo, M Taouil, S Hamdioui, P Weckx, S Cosemans, P Raghavan, ... | 3 | 2015 |
| Reliability modeling and mitigation for embedded memories IO Agbo, M Taouil, S Hamdioui 2019 IEEE International Test Conference (ITC), 1-10, 2019 | 2 | 2019 |
