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Yoichi Miyahara
Yoichi Miyahara
Department of Physics, Texas State University
Geverifieerd e-mailadres voor txstate.edu - Homepage
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Cantilever-based sensing: the origin of surface stress and optimization strategies
M Godin, V Tabard-Cossa, Y Miyahara, T Monga, PJ Williams, ...
Nanotechnology 21 (7), 075501, 2010
1662010
Detection of single-electron charging in an individual InAs quantum dot by noncontact atomic-force microscopy
R Stomp, Y Miyahara, S Schaer, Q Sun, H Guo, P Grutter, S Studenikin, ...
Physical review letters 94 (5), 056802, 2005
1572005
Strong electromechanical coupling of an atomic force microscope cantilever to a quantum dot
SD Bennett, L Cockins, Y Miyahara, P Grütter, AA Clerk
Physical review letters 104 (1), 017203, 2010
1032010
Energy levels of few-electron quantum dots imaged and characterized by atomic force microscopy
L Cockins, Y Miyahara, SD Bennett, AA Clerk, S Studenikin, P Poole, ...
Proceedings of the National Academy of Sciences 107 (21), 9496-9501, 2010
972010
Decoupling conservative and dissipative forces in frequency modulation atomic force microscopy
A Labuda, Y Miyahara, L Cockins, PH Grütter
Physical Review B 84 (12), 125433, 2011
572011
From tunneling to point contact: Correlation between forces and current
Y Sun, H Mortensen, S Schär, AS Lucier, Y Miyahara, P Grütter, W Hofer
Physical Review B 71 (19), 193407, 2005
572005
Non-contact atomic force microscope with a PZT cantilever used for deflection sensing, direct oscillation and feedback actuation
Y Miyahara, M Deschler, T Fujii, S Watanabe, H Bleuler
Applied surface science 188 (3-4), 450-455, 2002
552002
Retrofitting an atomic force microscope with photothermal excitation for a clean cantilever response in low Q environments
A Labuda, K Kobayashi, Y Miyahara, P Grütter
Review of Scientific Instruments 83 (5), 053703, 2012
542012
Determination of the local contact potential difference of PTCDA on NaCl: a comparison of techniques
SA Burke, JM LeDue, Y Miyahara, JM Topple, S Fostner, P Grütter
Nanotechnology 20 (26), 264012, 2009
542009
Minimum threshold for incipient plasticity in the atomic-scale nanoindentation of Au (111)
W Paul, D Oliver, Y Miyahara, PH Grütter
Physical review letters 110 (13), 135506, 2013
482013
Lead zirconate titanate cantilever for noncontact atomic force microscopy
Y Miyahara, T Fujii, S Watanabe, A Tonoli, S Carabelli, H Yamada, ...
Applied surface science 140 (3-4), 428-431, 1999
411999
Measurement of surface photovoltage by atomic force microscopy under pulsed illumination
Z Schumacher, Y Miyahara, A Spielhofer, P Grutter
Physical Review Applied 5 (4), 044018, 2016
362016
The limit of time resolution in frequency modulation atomic force microscopy by a pump-probe approach
Z Schumacher, A Spielhofer, Y Miyahara, P Grutter
Applied Physics Letters 110 (5), 053111, 2017
352017
Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope
T Hagedorn, ME Ouali, W Paul, D Oliver, Y Miyahara, P Grütter
Review of Scientific Instruments 82 (11), 113903, 2011
332011
Rapid mechanically controlled rewiring of neuronal circuits
MH Magdesian, GM Lopez-Ayon, M Mori, D Boudreau, ...
Journal of Neuroscience 36 (3), 979-987, 2016
292016
Tip-induced artifacts in magnetic force microscopy images
O Iglesias-Freire, JR Bates, Y Miyahara, A Asenjo, PH Grütter
Applied Physics Letters 102 (2), 022417, 2013
282013
Conductivity of an atomically defined metallic interface
DJ Oliver, J Maassen, M El Ouali, W Paul, T Hagedorn, Y Miyahara, Y Qi, ...
Proceedings of the National Academy of Sciences 109 (47), 19097-19102, 2012
282012
Implementation of atomically defined field ion microscopy tips in scanning probe microscopy
W Paul, Y Miyahara, P Grütter
Nanotechnology 23 (33), 335702, 2012
282012
Stochastic noise in atomic force microscopy
A Labuda, M Lysy, W Paul, Y Miyahara, P Grütter, R Bennewitz, M Sutton
Physical Review E 86 (3), 031104, 2012
272012
Excited-state spectroscopy on an individual quantum dot using atomic force microscopy
L Cockins, Y Miyahara, SD Bennett, AA Clerk, P Grutter
Nano letters 12 (2), 709-713, 2012
272012
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Artikelen 1–20