| 3D shape measurement of discontinuous specular objects based on advanced PMD with bi-telecentric lens Z Niu, N Gao, Z Zhang, F Gao, X Jiang Optics Express 26 (2), 1615-1632, 2018 | 46 | 2018 |
| Self-calibration of in situ monoscopic deflectometric measurement in precision optical manufacturing X Xu, X Zhang, Z Niu, W Wang, Y Zhu, M Xu Optics Express 27 (5), 7523-7536, 2019 | 45 | 2019 |
| Efficient phase retrieval of two-directional phase-shifting fringe patterns using geometric constraints of deflectometry Z Niu, X Xu, X Zhang, W Wang, Y Zhu, J Ye, M Xu, X Jiang Optics Express 27 (6), 8195-8207, 2019 | 32 | 2019 |
| Extra-detection-free monoscopic deflectometry for the in situ measurement of freeform specular surfaces X Xu, X Zhang, Z Niu, W Wang, M Xu Optics Letters 44 (17), 4271-4274, 2019 | 29 | 2019 |
| In-situ deflectometic measurement of transparent optics in precision robotic polishing J Ye, Z Niu, X Zhang, W Wang, M Xu Precision Engineering 64, 63-69, 2020 | 24 | 2020 |
| Calibration method for the relative orientation between the rotation axis and a camera using constrained global optimization Z Niu, K Liu, Y Wang, S Huang, X Deng, Z Zhang Measurement Science and Technology 28 (5), 055001, 2017 | 22 | 2017 |
| Full-field 3D shape measurement of specular surfaces by direct phase to depth relationship Z Zhang, Y Liu, S Huang, Z Niu, J Guo, N Gao, F Gao, X Jiang Optical Metrology and Inspection for Industrial Applications IV 10023, 164-174, 2016 | 22 | 2016 |
| Flexible one-shot geometric calibration for off-axis deflectometry Z Niu, X Zhang, J Ye, Y Zhu, M Xu, X Jiang Applied Optics 59 (13), 3819-3824, 2020 | 18 | 2020 |
| Simultaneous measurement of double surfaces of transparent lenses with phase measuring deflectometry J Ye, Z Niu, X Zhang, W Wang, M Xu Optics and Lasers in Engineering 137, 106356, 2021 | 14 | 2021 |
| Generic precise augmented reality guiding system and its calibration method based on 3D virtual model M Liu, S Yang, Z Wang, S Huang, Y Liu, Z Niu, X Zhang, J Zhu, Z Zhang Optics Express 24 (11), 12026-12042, 2016 | 14 | 2016 |
| Adaptive phase correction for phase measuring deflectometry based on light field modulation Z Niu, X Zhang, J Ye, L Ye, R Zhu, X Jiang IEEE Transactions on Instrumentation and Measurement 70, 1-10, 2021 | 10 | 2021 |
| Correction of aberration-induced phase errors in phase measuring deflectometry X Zhang, Z Niu, J Ye, M Xu Optics Letters 46 (9), 2047-2050, 2021 | 8 | 2021 |
| Wavefront-coded phase measuring deflectometry for the all-focused measurement Z Niu, J Wang, Y Tian, Z Wu, C Wei, J Shao Optics Letters 47 (18), 4770-4773, 2022 | 6 | 2022 |
| Iterative space-variant sphere-model deflectometry enabling designation-model-free measurement of the freeform surface Z Niu, Z Wu, S Wan, X Zhang, C Wei, J Shao Optics Express 30 (9), 14019-14032, 2022 | 5 | 2022 |
| Compensation of nonlinear errors of phase-shifted fringes in phase measuring deflectometry Z Niu, X Zhang, X Xu, Y Zhu, S Li, S Peng Ninth International Symposium on Precision Mechanical Measurements 11343, 7-11, 2019 | 4 | 2019 |
| Laser-based defect characterization and removal process for manufacturing fused silica optic with high ultraviolet laser damage threshold X Peng, X Cheng, C Wei, S Wan, K Ni, Z Niu, Y Han, Z Jiang, Z Cao, ... Light: Advanced Manufacturing 4 (3), 181-194, 2023 | 3 | 2023 |
| Precise positioning in the in-situ deflectometric measurement of optical surfaces X Zhang, X Xu, Z Niu, S Li, S Peng Applied Optical Metrology III 11102, 198-203, 2019 | 3 | 2019 |
| Aberration-induced errors in deflectometric measurement X Zhang, Z Niu, J Ye, S Li, W Zhao Optical Manufacturing and Testing XIII 11487, 103-108, 2020 | 1 | 2020 |
| Fast deflectometric measurement of freeform surfaces for ultra-precision optical manufacturing X Zhang, X Xu, Z Niu, R Zhu, M Xu 2019 International Conference on Optical Instruments and Technology …, 2020 | 1 | 2020 |
| In-situ measurement of aspherics with sub-aperture deflectometry for precision optical manufacturing X Zhang, X Xu, Z Niu, S Li, W Zhao Dimensional Optical Metrology and Inspection for Practical Applications VIII …, 2019 | 1 | 2019 |
