| Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays P Cloetens, W Ludwig, J Baruchel, D Van Dyck, J Van Landuyt, JP Guigay, ... Applied physics letters 75 (19), 2912-2914, 1999 | 1151 | 1999 |
| Statistical texture characterization from discrete wavelet representations G Van de Wouwer, P Scheunders, D Van Dyck IEEE transactions on image processing 8 (4), 592-598, 1999 | 763 | 1999 |
| Maximum-likelihood estimation of Rician distribution parameters J Sijbers, AJ Den Dekker, P Scheunders, D Van Dyck IEEE Transactions on Medical Imaging 17 (3), 357-361, 1998 | 555 | 1998 |
| Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy W Coene, G Janssen, MO de Beeck, D Van Dyck Physical Review Letters 69 (26), 3743, 1992 | 466 | 1992 |
| Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy WMJ Coene, A Thust, MO De Beeck, D Van Dyck Ultramicroscopy 64 (1-4), 109-135, 1996 | 435 | 1996 |
| Estimation of the noise in magnitude MR images J Sijbers, AJ den Dekker, J Van Audekerke, M Verhoye, D Van Dyck Magnetic resonance imaging 16 (1), 87-90, 1998 | 385 | 1998 |
| Focal-series reconstruction in HRTEM: Simulation studies on non-periodic objects A Thust, WMJ Coene, MO De Beeck, D Van Dyck Ultramicroscopy 64 (1-4), 211-230, 1996 | 335 | 1996 |
| Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy S Van Aert, J Verbeeck, R Erni, S Bals, M Luysberg, D Van Dyck, ... Ultramicroscopy 109 (10), 1236-1244, 2009 | 251 | 2009 |
| Watershed-based segmentation of 3D MR data for volume quantization J Sijbers, P Scheunders, M Verhoye, A Van der Linden, D Van Dyck, ... Magnetic resonance imaging 15 (6), 679-688, 1997 | 248 | 1997 |
| Desktop X‐ray microscopy and microtomography Sasov, V Dyck Journal of Microscopy 191 (2), 151-158, 1998 | 227 | 1998 |
| Wavelets for texture analysis, an overview S Livens, P Scheunders, G Van de Wouwer, D Van Dyck IET Digital Library, 1997 | 221 | 1997 |
| Electron microscopy: principles and fundamentals S Amelinckx, D Van Dyck, J Van Landuyt, G van Tendeloo John Wiley & Sons, 2008 | 219 | 2008 |
| A simple intuitive theory for electron diffraction D Van Dyck, MO De Beeck Ultramicroscopy 64 (1-4), 99-107, 1996 | 217 | 1996 |
| Wavelet correlation signatures for color texture characterization G Van de Wouwer, P Scheunders, S Livens, D Van Dyck Pattern recognition 32 (3), 443-451, 1999 | 206 | 1999 |
| Handbook of Microscopy: Applications in Materials Science S Amelinckx, D Van Dyck, J van Landuyt, G Van Tendeloo Solid-State Physics and Chemistry, 663, 1997 | 205* | 1997 |
| Wave function reconstruction in HRTEM: the parabola method MO De Beeck, D Van Dyck, W Coene Ultramicroscopy 64 (1-4), 167-183, 1996 | 190 | 1996 |
| Bias field correction for MRI images J Juntu, J Sijbers, D Van Dyck, J Gielen Computer Recognition Systems: Proceedings of the 4th International …, 2005 | 170 | 2005 |
| Machine learning study of several classifiers trained with texture analysis features to differentiate benign from malignant soft‐tissue tumors in T1‐MRI images J Juntu, J Sijbers, S De Backer, J Rajan, D Van Dyck Journal of Magnetic Resonance Imaging: An Official Journal of the …, 2010 | 169 | 2010 |
| Quantification and improvement of the signal-to-noise ratio in a magnetic resonance image acquisition procedure J Sijbers, P Scheunders, N Bonnet, D Van Dyck, E Raman Magnetic resonance imaging 14 (10), 1157-1163, 1996 | 166 | 1996 |
| Advanced electron microscopy for advanced materials G Van Tendeloo, S Bals, S Van Aert, J Verbeeck, D Van Dyck Advanced materials 24 (42), 5655-5675, 2012 | 163 | 2012 |
