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Dirk Van Dyck
Dirk Van Dyck
Onbekend partnerschap
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Titel
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Jaar
Holotomography: Quantitative phase tomography with micrometer resolution using hard synchrotron radiation x rays
P Cloetens, W Ludwig, J Baruchel, D Van Dyck, J Van Landuyt, JP Guigay, ...
Applied physics letters 75 (19), 2912-2914, 1999
10271999
Statistical texture characterization from discrete wavelet representations
G Van de Wouwer, P Scheunders, D Van Dyck
IEEE transactions on image processing 8 (4), 592-598, 1999
7511999
Maximum-likelihood estimation of Rician distribution parameters
J Sijbers, AJ den Dekker, P Scheunders, D Van Dyck
IEEE Transactions on Medical Imaging 17 (3), 357-361, 1998
5181998
Maximum-likelihood method for focus-variation image reconstruction in high resolution transmission electron microscopy
WMJ Coene, A Thust, MO De Beeck, D Van Dyck
Ultramicroscopy 64 (1-4), 109-135, 1996
4671996
Phase retrieval through focus variation for ultra-resolution in field-emission transmission electron microscopy
W Coene, G Janssen, MO de Beeck, D Van Dyck
Physical Review Letters 69 (26), 3743, 1992
4471992
Estimation of the noise in magnitude MR images
J Sijbers, AJ den Dekker, J Van Audekerke, M Verhoye, D Van Dyck
Magnetic resonance imaging 16 (1), 87-90, 1998
3651998
Focal-series reconstruction in HRTEM: Simulation studies on non-periodic objects
A Thust, WMJ Coene, MO De Beeck, D Van Dyck
Ultramicroscopy 64 (1-4), 211-230, 1996
3241996
Watershed-based segmentation of 3D MR data for volume quantization
J Sijbers, P Scheunders, M Verhoye, A Van der Linden, D Van Dyck, ...
Magnetic Resonance Imaging 15 (6), 679-688, 1997
2361997
A simple intuitive theory for electron diffraction
D Van Dyck, MO De Beeck
Ultramicroscopy 64 (1-4), 99-107, 1996
2181996
Desktop X‐ray microscopy and microtomography
V Dyck
Journal of Microscopy 191 (2), 151-158, 1998
2171998
Quantitative atomic resolution mapping using high-angle annular dark field scanning transmission electron microscopy
S Van Aert, J Verbeeck, R Erni, S Bals, M Luysberg, D Van Dyck, ...
Ultramicroscopy 109 (10), 1236-1244, 2009
2132009
Handbook of Microscopy: Applications in Materials Science
S Amelinckx, D Van Dyck, J van Landuyt, G Van Tendeloo
Solid-State Physics and Chemistry, 663, 1997
204*1997
Wavelet correlation signatures for color texture characterization
G Van de Wouwer, P Scheunders, S Livens, D Van Dyck
Pattern recognition 32 (3), 443-451, 1999
2001999
Wavelets for texture analysis, an overview
S Livens, P Scheunders, G Van de Wouwer, D Van Dyck
IET Digital Library, 1997
1951997
Electron microscopy: principles and fundamentals
S Amelinckx, D Van Dyck, J Van Landuyt, G van Tendeloo
John Wiley & Sons, 2008
1792008
Wave function reconstruction in HRTEM: the parabola method
MO De Beeck, D Van Dyck, W Coene
Ultramicroscopy 64 (1-4), 167-183, 1996
1751996
Quantification and improvement of the signal-to-noise ratio in a magnetic resonance image acquisition procedure
J Sijbers, P Scheunders, N Bonnet, D Van Dyck, E Raman
Magnetic resonance imaging 14 (10), 1157-1163, 1996
1491996
Parameter estimation from magnitude MR images
J Sijbers, AJ den Dekker, E Raman, D Van Dyck
International Journal of imaging systems and technology 10 (2), 109-114, 1999
1441999
Machine learning study of several classifiers trained with texture analysis features to differentiate benign from malignant soft‐tissue tumors in T1‐MRI images
J Juntu, J Sijbers, S De Backer, J Rajan, D Van Dyck
Journal of Magnetic Resonance Imaging: An Official Journal of the …, 2010
1332010
Advanced electron microscopy for advanced materials
G Van Tendeloo, S Bals, S Van Aert, J Verbeeck, D Van Dyck
Advanced materials 24 (42), 5655-5675, 2012
1322012
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Artikelen 1–20