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Han Haitjema
Han Haitjema
Verified email at kuleuven.be - Homepage
Title
Cited by
Cited by
Year
Geometric error measurement and compensation of machines—an update
H Schwenke, W Knapp, H Haitjema, A Weckenmann, R Schmitt, ...
CIRP annals 57 (2), 660-675, 2008
12032008
Measurement technologies for precision positioning
W Gao, SW Kim, H Bosse, H Haitjema, YL Chen, XD Lu, W Knapp, ...
CIRP annals 64 (2), 773-796, 2015
5162015
Dimensional micro and nano metrology
HN Hansen, K Carneiro, H Haitjema, L De Chiffre
CIRP annals 55 (2), 721-743, 2006
4182006
On-machine and in-process surface metrology for precision manufacturing
W Gao, H Haitjema, FZ Fang, RK Leach, CF Cheung, E Savio, JM Linares
Cirp Annals 68 (2), 843-866, 2019
3382019
Modeling and verifying non-linearities in heterodyne displacement interferometry
S Cosijns, H Haitjema, PHJ Schellekens
Precision engineering 26 (4), 448-455, 2002
1872002
CIRP encyclopedia of production engineering
S Chatti, L Laperričre, G Reinhart, T Tolio
Springer, 2019
1642019
Bandwidth characteristics and comparisons of surface texture measuring instruments
R Leach, H Haitjema
Measurement Science and Technology 21 (3), 032001, 2010
1402010
Calibration and verification of areal surface texture measuring instruments
RK Leach, CL Giusca, H Haitjema, C Evans, X Jiang
CIRP Annals 64 (2), 797-813, 2015
1392015
Development of a silicon-based nanoprobe system for 3-D measurements
H Haitjema, WO Pril, PHJ Schellekens
CIRP Annals 50 (1), 365-368, 2001
1242001
Bio-inspired textures for functional applications
AP Malshe, S Bapat, KP Rajurkar, H Haitjema
Cirp Annals 67 (2), 627-650, 2018
1042018
Deformation and wear of pyramidal, silicon-nitride AFM tips scanning micrometre-size features in contact mode
ML Bloo, H Haitjema, WO Pril
Measurement 25 (3), 203-211, 1999
951999
The optical, electrical and structural properties of fluorine-doped, pyrolytically sprayed tindioxide coatings
H Haitjema, JJP Elich, CJ Hoogendoorn
Solar energy materials 18 (5), 283-297, 1989
801989
Calibration of displacement sensors up to 300 µm with nanometre accuracy and direct traceability to a primary standard of length
H Haitjema, PHJ Schellekens, S Wetzels
Metrologia 37 (1), 25, 2000
722000
Uncertainty in measurement of surface topography
H Haitjema
Surf.Topogr.:Metrol.Prop. 3 (2015), 035004, 2015
692015
Uncertainty analysis of roughness standard calibration using stylus instruments
H Haitjema
Precision Engineering 22 (2), 110-119, 1998
651998
Metrological characteristics for the calibration of surface topography measuring instruments: a review
R Leach, H Haitjema, R Su, A Thompson
Measurement Science and Technology 32 (3), 032001, 2020
612020
Physical properties of pyrolytically sprayed tin-doped indium oxide coatings
H Haitjema, JJP Elich
Thin solid films 205 (1), 93-100, 1991
571991
Noise bias removal in profile measurements
H Haitjema, MAA Morel
Measurement 38 (1), 21-29, 2005
542005
The physical properties of fluorine-doped tin dioxide films and the influence of ageing and impurity effects
H Haitjema, J Elich
Solar energy materials 16 (1-3), 79-90, 1987
531987
International comparison of roundness profiles with nanometric accuracy
H Haitjema, H Bosse, M Frennberg, A Sacconi, R Thalmann
Metrologia 33 (1), 67, 1996
481996
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