Han Haitjema
Han Haitjema
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Geometric error measurement and compensation of machines—an update
H Schwenke, W Knapp, H Haitjema, A Weckenmann, R Schmitt, ...
CIRP annals 57 (2), 660-675, 2008
9822008
Dimensional micro and nano metrology
HN Hansen, K Carneiro, H Haitjema, L De Chiffre
CIRP annals 55 (2), 721-743, 2006
3632006
Measurement technologies for precision positioning
W Gao, SW Kim, H Bosse, H Haitjema, YL Chen, XD Lu, W Knapp, ...
CIRP Annals 64 (2), 773-796, 2015
3002015
Modeling and verifying non-linearities in heterodyne displacement interferometry
S Cosijns, H Haitjema, PHJ Schellekens
Precision engineering 26 (4), 448-455, 2002
1712002
Development of a silicon-based nanoprobe system for 3-D measurements
H Haitjema, WO Pril, PHJ Schellekens
CIRP Annals 50 (1), 365-368, 2001
1122001
Bandwidth characteristics and comparisons of surface texture measuring instruments
R Leach, H Haitjema
Measurement Science and Technology 21 (3), 032001, 2010
1062010
On-machine and in-process surface metrology for precision manufacturing
W Gao, H Haitjema, FZ Fang, RK Leach, CF Cheung, E Savio, JM Linares
CIRP Annals 68 (2), 843-866, 2019
1022019
Calibration and verification of areal surface texture measuring instruments
RK Leach, CL Giusca, H Haitjema, C Evans, X Jiang
CIRP Annals 64 (2), 797-813, 2015
942015
Deformation and wear of pyramidal, silicon-nitride AFM tips scanning micrometre-size features in contact mode
ML Bloo, H Haitjema, WO Pril
Measurement 25 (3), 203-211, 1999
781999
The optical, electrical and structural properties of fluorine-doped, pyrolytically sprayed tindioxide coatings
H Haitjema, JJP Elich, CJ Hoogendoorn
Solar energy materials 18 (5), 283-297, 1989
761989
Calibration of displacement sensors up to 300 m with nanometre accuracy and direct traceability to a primary standard of length
H Haitjema, PHJ Schellekens, S Wetzels
Metrologia 37 (1), 25, 2000
672000
Uncertainty analysis of roughness standard calibration using stylus instruments
H Haitjema
Precision Engineering 22 (2), 110-119, 1998
621998
Physical properties of pyrolytically sprayed tin-doped indium oxide coatings
H Haitjema, JJP Elich
Thin solid films 205 (1), 93-100, 1991
581991
The physical properties of fluorine-doped tin dioxide films and the influence of ageing and impurity effects
H Haitjema, J Elich
Solar energy materials 16 (1-3), 79-90, 1987
471987
Dynamic probe calibration in the μm region with nanometric accuracy
H Haitjema
Precision Engineering 19 (2-3), 98-104, 1996
431996
Noise bias removal in profile measurements
H Haitjema, MAA Morel
Measurement 38 (1), 21-29, 2005
392005
Displacement Laser Interferometry with Sub-nanometer Uncertainty
SJAG Cosijns, H Haitjema, PHJ Schellekens
ASPE Conference on Precision Interferometric Metrology, 2005
382005
A novel technique for calibration of polygon angles with non-integer subdivision of indexing table
T Yandayan, SA Akgz, H Haitjema
Precision engineering 26 (4), 412-424, 2002
382002
International comparison of roundness profiles with nanometric accuracy
H Haitjema, H Bosse, M Frennberg, A Sacconi, R Thalmann
Metrologia 33 (1), 67, 1996
381996
Bio-inspired textures for functional applications
AP Malshe, S Bapat, KP Rajurkar, H Haitjema
CIRP Annals 67 (2), 627-650, 2018
372018
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Artikelen 1–20