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Co-authors
Raghunath HolambeSGGS Inst of Engg and Tech, Vishnupuri, Nanded, IndiaVerified email at sggs.ac.in
Vikram GadreProfessor, Electrical Engineering, IIT BombayVerified email at ee.iitb.ac.in
Pushkar G PatwardhanIndian Institute of Technology, BombayVerified email at tensilica.com
Mukund B. NagareSGGS Institute of Engineering and Technolgy, NandedVerified email at sggs.ac.in
Rajesh LangojuEPFLVerified email at ge.com
Swati MadheAsst. Prof, Instrumentaion & Control, Cummins College of Engineering.Verified email at cumminscollege.in
Dr. Parul Arora BhalotraE&TC savitribai Phule Pune UniversityVerified email at raisoni.net
Dr. Amol D. RahulkarNational Institute of Technology (NIT), GoaVerified email at nitgoa.ac.in
Nilam GhugeProfessor in Electrical EngineeringVerified email at jspmbsiotr.edu.in
Prasad SudhakarStaff Scientist, GE HealthcareVerified email at ge.com
Suresh Emmanuel JoelGeneral Electric Global ResearchVerified email at ge.com
Pavan SudheendraPrincipal Engineer, Samsung R&D Institute India-BangaloreVerified email at samsung.com
Mahesh PanickerAssociate Professor, Indian Institute of Technology (IIT) PalakkadVerified email at iitpkd.ac.in
Radhika MadhavanGE Global ResearchVerified email at ge.com
Aditya HegdeJohns Hopkins UniversityVerified email at cs.jhu.edu
Abhijit PatilEcole Polytechnique Federale de LausanneVerified email at ge.com
Sahika GencAmazon Web ServicesVerified email at amazon.com
Navneeth SubramanianCanon IncVerified email at canon.co.jp
Sandeep KaushikMR AI Lead Scientist, GE HealthCare, MunichVerified email at ge.com
Rakesh MullickGE Global Research CenterVerified email at ge.com