Peter J. de Groot
Peter J. de Groot
Zygo Corporation
Verified email at zygo.com
Title
Cited by
Cited by
Year
Surface profiling by analysis of white-light interferograms in the spatial frequency domain
P De Groot, L Deck
Journal of modern optics 42 (2), 389-401, 1995
5211995
High-speed noncontact profiler based on scanning white-light interferometry
L Deck, P De Groot
Applied optics 33 (31), 7334-7338, 1994
4961994
Three-dimensional imaging by sub-Nyquist sampling of white-light interferograms
P de Groot, L Deck
Optics letters 18 (17), 1462-1464, 1993
3941993
Derivation of algorithms for phase-shifting interferometry using the concept of a data-sampling window
P De Groot
Applied optics 34 (22), 4723-4730, 1995
3421995
Ranging and velocimetry signal generation in a backscatter-modulated laser diode
PJ de Groot, GM Gallatin, SH Macomber
Applied optics 27 (21), 4475-4480, 1988
2791988
Principles of interference microscopy for the measurement of surface topography
P de Groot
Advances in Optics and Photonics 7 (1), 1-65, 2015
2672015
Determination of fringe order in white-light interference microscopy
P de Groot, XC de Lega, J Kramer, M Turzhitsky
Applied optics 41 (22), 4571-4578, 2002
2632002
Vibration in phase-shifting interferometry
PJ De Groot
JOSA A 12 (2), 354-365, 1995
2371995
Measurement of transparent plates with wavelength-tuned phase-shifting interferometry
P De Groot
Applied optics 39 (16), 2658-2663, 2000
2322000
Method and system for profiling objects having multiple reflective surfaces using wavelength-tuning phase-shifting interferometry
P de Groot
US Patent 6,359,692, 2002
2192002
Signal modeling for low-coherence height-scanning interference microscopy
P de Groot, XC de Lega
Applied optics 43 (25), 4821-4830, 2004
2092004
Method and apparatus for surface topography measurement by spatial-frequency analysis of interferograms
P De Groot
US Patent 5,398,113, 1995
2061995
Profiling complex surface structures using scanning interferometry
PJ De Groot, R Stoner, XC De Lega
US Patent 7,271,918, 2007
1752007
Interferometry method and system including spectral decomposition
XC De Lega, P De Groot
US Patent 7,636,168, 2009
1632009
Coherence scanning interferometry
P de Groot
Optical measurement of surface topography, 187-208, 2011
143*2011
Infrared scanning interferometry apparatus and method
XC De Lega, P De Groot, LL Deck
US Patent 6,195,168, 2001
1302001
Interferometric optical systems having simultaneously scanned optical path length and focus
PJ De Groot, XC De Lega, S Balasubramaniam
US Patent 7,012,700, 2006
1132006
Interpreting interferometric height measurements using the instrument transfer function
P de Groot, XC de Lega
Fringe 2005, 30-37, 2006
1132006
Coherence scanning interferometry
P de Groot
Optical measurement of surface topography, 187-208, 2011
1122011
Interferometry method for ellipsometry, reflectometry, and scatterometry measurements, including characterization of thin film structures
PJ De Groot
US Patent 7,139,081, 2006
1102006
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