| Scan chain encryption for the test, diagnosis and debug of secure circuits M Da Silva, M Flottes, G Di Natale, B Rouzeyre, P Prinetto, M Restifo 2017 22nd IEEE European Test Symposium (ETS), 1-6, 2017 | 35 | 2017 |
| A comprehensive methodology for stress procedures evaluation and comparison for Burn-In of automotive SoC D Appello, P Bernardi, G Giacopelli, A Motta, A Pagani, G Pollaccia, ... Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 23 | 2017 |
| About on-line functionally untestable fault identification in microprocessor cores for safety-critical applications R Cantoro, A Firrincieli, D Piumatti, M Restifo, E Sánchez, MS Reorda 2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018 | 18 | 2018 |
| Effective screening of automotive SoCs by combining burn-in and system level test F Almeida, P Bernardi, D Calabrese, M Restifo, MS Reorda, D Appello, ... 2019 IEEE 22nd International Symposium on Design and Diagnostics of …, 2019 | 16 | 2019 |
| An evolutionary approach to hardware encryption and trojan-horse mitigation A Marcelli, M Restifo, E Sanchez, G Squillero Design, Automation & Test in Europe Conference & Exhibition (DATE), 2017 …, 2017 | 16 | 2017 |
| An optimized test during burn-in for automotive SoC D Appello, C Bugeja, G Pollaccia, P Bernardi, R Cantoro, M Restifo, ... IEEE Design & Test 35 (3), 46-53, 2018 | 13 | 2018 |
| Applicative system level test introduction to increase confidence on screening quality P Bernardi, M Restifo, MS Reorda, D Appello, C Bertani, D Petrali 2020 23rd International Symposium on Design and Diagnostics of Electronic …, 2020 | 10 | 2020 |
| A DMA and CACHE-based stress schema for burn-in of automotive microcontroller P Bernardi, R Cantoro, L Gianotto, M Restifo, E Sánchez, F Venini, ... 2017 18th IEEE Latin American Test Symposium (LATS), 1-6, 2017 | 10 | 2017 |
| On-line software-based self-test for ECC of embedded RAM memories M Restifo, P Bernardi, S De Luca, A Sansonetti 2017 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2017 | 7 | 2017 |
| On the in-field test of embedded memories P Bernardi, M Restifo, E Sánchez, MS Reorda 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System …, 2017 | 4 | 2017 |
| A Hybrid In-Field Self-Test Technique for SoCs S Carbonara, P Bernardi, M Restifo 2019 14th International Conference on Design & Technology of Integrated …, 2019 | 2 | 2019 |
| Self-testing of multicore processors MA Skitsas, M Restifo, MK Michael, C Nicopoulos, P Bernardi, E Sanchez IET Digital Library, 2019 | 1 | 2019 |
| An Evolutionary Algorithm Approach to Stress Program Generation During Burn-In D Appello, P Bernardi, C Bugeja, R Cantoro, A Colazzo, A Motta, ... Journal of Low Power Electronics 14 (1), 86-98, 2018 | 1 | 2018 |
| Reliability and Testing of Complex Safety-Critical Automotive SoC M Restifo Politecnico di Torino, 2020 | | 2020 |
| Innovative Practices on Automotive Test W Dobbelaere, M Restifo, P Sarson 2019 IEEE 37th VLSI Test Symposium (VTS), 1-1, 2019 | | 2019 |
| Adaptive Management Techniques for Optimized Burn-in of Safety-Critical SoC D Appello, P Bernardi, C Bugeja, R Cantoro, G Pollaccia, M Restifo, ... Journal of Electronic Testing 34, 43-52, 2018 | | 2018 |
paolo bernardiPolitecnico di TorinoVerified email at polito.it
