| March LR: A test for realistic linked faults AJ van de Goor, GN Gaydadjiev, VG Mikitjuk, VN Yarmolik Proceedings of 14th VLSI Test Symposium, 272-280, 1996 | 172 | 1996 |
| Контроль и диагностика цифровых узлов ЭВМ ВН Ярмолик Наука и техника, 1988 | 113 | 1988 |
| Generation and application of pseudorandom sequences for random testing VN Yarmolik, SN Demidenko John Wiley & Sons, Inc., 1988 | 110 | 1988 |
| Генерирование и применение псевдослучайных сигналов в системах испытания и контроля ВН Ярмолик, СН Демиденко Мн Наука и техника, 1986 | 59 | 1986 |
| Физически неклонируемые функции ВН Ярмолик, ЮГ Вашинко Информатика, 92-103, 2011 | 56* | 2011 |
| Transparent memory testing for pattern sensitive faults MG Karpovsky, VN Yarmolik Proceedings., International Test Conference, 860-869, 1995 | 52 | 1995 |
| Efficient online and offline testing of embedded DRAMs S Hellebrand, HJ Wunderlich, AA Ivaniuk, YV Klimets, VN Yarmolik IEEE Transactions on Computers 51 (7), 801-809, 2002 | 51 | 2002 |
| RAM testing algorithms for detection multiple linked faults VG Mikitjuk, VN Yarmolik, AJ Van De Goor Proceedings ED&TC European design and test conference, 435-439, 1996 | 50 | 1996 |
| March PS (23N) test for DRAM pattern-sensitive faults V Yarmolik, Y Klimets, S Demidenko Proceedings Seventh Asian Test Symposium (ATS'98)(Cat. No. 98TB100259), 354-357, 1998 | 48 | 1998 |
| Obfuscation as intellectual rights protection in VHDL language M Brzozowski, VN Yarmolik 6th International Conference on Computer Information Systems and Industrial …, 2007 | 46 | 2007 |
| Symmetric transparent BIST for RAMs VN Yarmolik, S Hellebrand Design, Automation and Test in Europe Conference and Exhibition, 1999 …, 1999 | 45 | 1999 |
| March LA: a test for linked memory faults. AJ van de Goor, G Gaydadjiev, VN Yarmolik, VG Mikitjuk ED&TC, 627, 1997 | 44 | 1997 |
| Transparent memory BIST MG Karpovsky, VN Yarmolik Proceedings of IEEE International Workshop on Memory Technology, Design, and …, 1994 | 44 | 1994 |
| Self-adjusting output data compression: An efficient BIST technique for RAMs VN Yarmolik, S Hellebrand, HJ Wunderlich Proceedings Design, Automation and Test in Europe, 173-179, 1998 | 41 | 1998 |
| RAM diagnostic tests V Yarmolik | 38 | 1996 |
| Iterative antirandom testing I Mrozek, VN Yarmolik Journal of Electronic Testing 28, 301-315, 2012 | 36 | 2012 |
| Pseudo-exhaustive word-oriented DRAM testing MG Karpovsky, AJ van de Goor, VN Yarmolik Proceedings the European Design and Test Conference. ED&TC 1995, 126-132, 1995 | 36 | 1995 |
| Fault diagnosis of digital circuits VN Yarmolik John Wiley & Sons, Inc.Chichester, 1990 | 33 | 1990 |
| Маршевые тесты для самотестирования ОЗУ СВ Ярмолик, АП Занкович, АА Иванюк Минск: Издательский центр БГУ, 2009 | 32 | 2009 |
| Antirandom test vectors for BIST in hardware/software systems I Mrozek, V Yarmolik Fundamenta Informaticae 119 (2), 163-185, 2012 | 29 | 2012 |
Ireneusz MrozekBialystok University of TechnologyGeverifieerd e-mailadres voor pb.edu.pl
