Prediction of phase formation sequence and phase stability in binary metal‐aluminum thin‐film systems using the effective heat of formation rule
R Pretorius, AM Vredenberg, FW Saris… - Journal of applied …, 1991 - pubs.aip.org
The effective heat of formation (ΔH′) concept allows heats of formation to be calculated as
a function of concentration. In this work the effective heat of formation rule is used to predict …
a function of concentration. In this work the effective heat of formation rule is used to predict …
Nonthermal pulsed laser annealing of Si; plasma annealing
JA Van Vechten, R Tsu, FW Saris - Physics Letters A, 1979 - Elsevier
NONTHERMALPULSED LASER ANNEALING OF Si; PLASMA ANNEALING JA Van VECHTEN’
and R. TSU and FW SARIS In the accompanying [11 p Page 1 Volume 74A, number 6 …
and R. TSU and FW SARIS In the accompanying [11 p Page 1 Volume 74A, number 6 …
Reasons to believe pulsed laser annealing of Si does not involve simple thermal melting
JA Van Vechten, R Tsu, FW Saris, D Hoonhout - Physics Letters A, 1979 - Elsevier
REASONS TO BELIEVE PULSED LASER ANNEALING OF Si DOES NOT INVOLVE
SIMPLE THERMAL MELTING JA Van VECHTEN’ and R. TSU and FW Page 1 Volume 74A …
SIMPLE THERMAL MELTING JA Van VECHTEN’ and R. TSU and FW Page 1 Volume 74A …
Stability of amorphous Cu/Ta and Cu/W alloys
M Nastasi, FW Saris, LS Hung, JW Mayer - Journal of applied physics, 1985 - pubs.aip.org
Although both the Cu/W and Cu/Ta alloy systems are known to be immiscible, the response
of coevaporated amorphous films of a‐Cu x W 1−x (x=0.45–0.72) and a‐Cu x Ta 1−x (x=0.10…
of coevaporated amorphous films of a‐Cu x W 1−x (x=0.45–0.72) and a‐Cu x Ta 1−x (x=0.10…
Angle resolved detection of charged particles with a novel type toroidal electrostatic analyser
RG Smeenk, RM Tromp, HH Kersten… - Nuclear Instruments and …, 1982 - Elsevier
A novel type of toroidal electrostatic energy analyser is described with position sensitive
detection of the particles passing the exit slit of the analyser, different positions corresponding to …
detection of the particles passing the exit slit of the analyser, different positions corresponding to …
Use of the effective heat of formation rule for predicting phase formation sequence in Al Ni systems
R Pretorius, R De Reus, AM Vredenberg, FW Saris - Materials Letters, 1990 - Elsevier
The effective heat of formation (ΔH') of any compound can be calculated as a function of the
concentration of its components. By using this concept in conjunction with the lowest eutectic …
concentration of its components. By using this concept in conjunction with the lowest eutectic …
Radiative transitions between quasimolecular levels during energetic atom-atom collisions
FW Saris, WF Van der Weg, H Tawara, R Laubert - Physical Review Letters, 1972 - APS
We report the observation of an x-ray band which cannot be identified as a characteristic
atomic x ray either of the target atoms or of the projectiles. The new x ray has been observed …
atomic x ray either of the target atoms or of the projectiles. The new x ray has been observed …
Oxygen in titanium nitride diffusion barriers
W Sinke, GPA Frijlink, FW Saris - Applied physics letters, 1985 - pubs.aip.org
Oxygen has been found to playa dominant role in TiN barrier performance between Si {1 (0)
and AI. When TiN is exposed to air prior to Al deposition, interdiffusion of the Si/TiN/AI …
and AI. When TiN is exposed to air prior to Al deposition, interdiffusion of the Si/TiN/AI …
Pre-amorphization damage in ion-implanted silicon
RJ Schreutelkamp, JS Custer, JR Liefting, WX Lu… - Materials science …, 1991 - Elsevier
Ion implantation in silicon with doses below the amorphization threshold can lead to the
formation of dislocations after high-temperature annealing. We have studied this for implants of …
formation of dislocations after high-temperature annealing. We have studied this for implants of …
Energy backtransfer and infrared photoresponse in erbium-doped silicon diodes
N Hamelin, PG Kik, JF Suyver, K Kikoin… - Journal of Applied …, 2000 - pubs.aip.org
Temperature-dependent measurements of the photoluminescence (PL) intensity, PL lifetime,
and infrared photocurrent, were performed on an erbium-implanted silicon p–n junction in …
and infrared photocurrent, were performed on an erbium-implanted silicon p–n junction in …